The standard formalizes aspects of fault models as they are relevant to the generation of test patterns for digital circuits. Its scope includes (i) fault counting, (ii) fault classification, and (iii) fault coverage reporting across different ATPG (automatic test pattern generation) tools, for the single stuck-at fault model. With this standard, it shall be incumbent on all ATPG tools (which comply with this standard) to report fault coverage in a uniform way. This will facilitate the generation of a uniform coverage (and hence a uniform test quality) metric for large chips (including systems-on-chips - SOCs) with different cores and modules, for which test patterns have been independently generated.
- Sponsor Committee
- C/TT - Test Technology
Learn More About C/TT - Test Technology - Status
- Active Standard
- PAR Approval
- 2009-03-19
- Board Approval
- 2017-12-06
- History
-
- Published:
- 2018-01-31
Working Group Details
- Society
- IEEE Computer Society
Learn More About IEEE Computer Society - Sponsor Committee
- C/TT - Test Technology
Learn More About C/TT - Test Technology - Working Group
-
FACR 1804 - Fault Accounting and Coverage Reporting to Digital Modules (FACR)
- IEEE Program Manager
- Tom Thompson
Contact Tom Thompson - Working Group Chair
- Rajesh Raina
Other Activities From This Working Group
Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.
No Active Projects
Standards approved by the IEEE SA Standards Board that are within the 10-year lifecycle.
No Active Standards
These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.
No Superseded Standards
These standards have been removed from active status through a ballot where the standard is made inactive as a consensus decision of a balloting group.
No Inactive-Withdrawn Standards
These standards are removed from active status through an administrative process for standards that have not undergone a revision process within 10 years.
No Inactive-Reserved Standards