Description: This standard describes a methodology for accessing instrumentation embedded within a semiconductor device without defining the instruments or their features themselves, via the IEEE 1149.1 Test Access Port (TAP) and/or other signals. The elements of the methodology include a hardware architecture for the on-chip network connecting the instruments to the chip pins, a hardware description language to describe this network, and a software language and protocol for communicating with the instruments via this network.
Oversight Committee: C/TT - Test Technology
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