Working Group Details
B03W/P592_WG - Exposed Semi-con Test Working Group
|Working Group Chair||
|IEEE Program Manager|
IEEE 592-2007 - IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors
Revision of IEEE Std 592-1990. Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV is provided in this standard.