With the ongoing development and use of electronic devices across numerous industries worldwide, there is a global need to standardize terms and the test and computational methods used to describe and/or measure the parameters that characterize and define the performance of signaling devices.
End users demand that their devices operate effectively and are capable of generating and receiving vast amounts of information that involves the subsequent measurement and analysis of waveforms acquired through those signals. As a result, standardization is essential for accurate, reproducible, reliable, and communicable characterization of the performance of these devices.
IEEE TC10, the Waveform Generation, Measurement, and Analysis Committee, develops documentary standards to address the needs of supporting technology and product advancement, product comparison and performance tracking, and device calibration and traceability.
TC10 comprises an international group of electronics engineers, mathematicians, professors and physicists with representatives from national metrology laboratories, national science laboratories, component manufacturers, the test instrumentation industry, academia, and end users.
The technical committee works to develop, promote and support standards for specifying and measuring waveforms, and for specifying and testing instrumentation used for waveform measurement or generation, endorses effective practices of waveform measurement, generation, and analysis through workshops, review papers, etc., and maintains liaison with other groups, societies, and standards organizations working in the same area.
Enhancing Interoperability
TC10 is currently in the process of revising two existing standards for electronic components:
- IEEE P1241™ – Standard for Terminology and Test Methods for Analog-to-Digital Converters
- This standard identifies ADC error sources and provides test methods to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors. (e.g., correction for gain and offset)
- IEEE P1658™ – Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices
- This standard defines terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs). It is restricted to monolithic, hybrid, and module DACs and does not cover systems encompassing DACs. The standard is being revised to clear up confusion relating to the terms and definitions concerning DACs. Test methods are defined with expected output and analysis of the data generated from test methods. Product specifications are defined in clear terms to be understandable by all international users and manufacturers.
Calling for Participation
What holds true for all technical standard domains is that by participating you can guide the development of and contribute to the international standards that directly affect your industry, better focus your research, and positively impact your procurement decisions.
TC10, whose scope covers the science, technology, and application of electronic instrumentation and electrical measurement, is currently working on a number of projects that could greatly benefit by the participation of stakeholders from the electronics industry, including those working in the commercial, industrial, military, medical, environmental, and manufacturing fields, as well as university, laboratory, telecommunications and imaging professionals.
We invite you to join the TC10 membership where you can make your mark and bring measurable benefits to your industry and organization.
Learn More About the IEEE TC10, or Explore Ways To Participate
Author: Nicholas Paulter, Standards Committee Chair, IEEE TC10
