Active Standard

IEEE 1241-2023

IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters

The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.

Sponsor Committee
IM/WM&A - TC10 - Waveform Generation Measurement and Analysis
Learn More About IM/WM&A - TC10 - Waveform Generation Measurement and Analysis
Status
Active Standard
PAR Approval
2016-06-30
Superseding
1241-2010
Board Approval
2023-06-05
History
Published:
2023-10-06

Working Group Details

Society
IEEE Instrumentation and Measurement Society
Learn More About IEEE Instrumentation and Measurement Society
Sponsor Committee
IM/WM&A - TC10 - Waveform Generation Measurement and Analysis
Learn More About IM/WM&A - TC10 - Waveform Generation Measurement and Analysis
Working Group
ADC - Working Group for Analog-to-Digital Converters
IEEE Program Manager
Patrycja Jarosz
Contact Patrycja Jarosz
Working Group Chair
Steven Tilden

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1241-2010
IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters

The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.

Learn More About 1241-2010

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