592-2007 - IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors
Standard Details
Revision of IEEE Std 592-1990. Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV is provided in this standard.
Standards Committee
Superseded by
Board Approval
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Existing Standards