IEEE 300-1988 - IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors
Standard Details
This standard applies to semiconductor radiation detectors that are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described were selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the methods are too complex or require equipment (such as particle accelerators) which may not be readily available. Test procedures for the associated amplifiers and preamplifiers are described in ANSI/IEEE Std 301-1988
Sponsor Committee
Board Approval
Working Group Details
Working Group
Working Group Chair
Sponsor Committee
IEEE Program Manager
Existing Standards