This standard deals with the methods of measurement of important characteristics of transistors. In general, these characteristics are referred to as parameters of the devices. Because of the youthfulness of the transistor art, methods of testing transistors will continue to change considerably before the art can be considered to have stabilized sufficiently for complete standardization. This standard corresponds to the current state of transistor testing methods, and its publication by the IRE is considered preferable to waiting for a future stabilization of the many rapid changes now characteristic of this field
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