Active PAR

PC62.39

Standard for Test Methods and Preferred Values for Self-Restoring Current-Limiter Components Used in Telecommunication Surge Protection

This standard sets terms, test methods, test circuits, measurement procedures and preferred result values for series connected, self-restoring current-limiter components used in low-voltage telecommunication circuit surge protection. It is only applicable for components in telecommunications circuits with sinusoidal ringing voltages up to 150 V rms at 15 Hz to 70 Hz and dc powering voltages up to 400 V. The self-restoring current limiters covered by this standard have the following properties: - Excessive current causes a transition from a low-resistance state to a high-resistance state - Reverts to a low-resistance state when the excessive current ends - Directly operated by the current flow through the component - Solid-state (no moving parts) - Withstands specified levels of impulse - Withstands specified ac voltage levels when in the high-resistance state Examples of this type of current-limiter technology are positive temperature coefficient (PTC) stepfunction theremistors of ceramic or polymeric material and silicon semiconductor based electronic circuits. This standard does not cover self-restoring current-limiter components used in applications other than low-voltage telecommunication circuit surge protection such as heaters, inrush-current limiters, or sensing devices. Current interrupting type components, which reduce the current to zero by a mechanical circuit break, are not covered by this standard. In this standard, a telecommunications circuit is a circuit that uses metallic conductors to handle the remote transmission of information, such as data, communications, and signaling.

Sponsor Committee
PE/SPDLV - Surge Protective Devices/Low Voltage
Learn More About PE/SPDLV - Surge Protective Devices/Low Voltage
Status
Active PAR
PAR Approval
2023-12-06
Superseding
C62.39-2012

Working Group Details

Society
IEEE Power and Energy Society
Learn More About IEEE Power and Energy Society
Sponsor Committee
PE/SPDLV - Surge Protective Devices/Low Voltage
Learn More About PE/SPDLV - Surge Protective Devices/Low Voltage
Working Group
LV3.6.2 - 3.6.2 LV Solid State Surge Protective Components WG
IEEE Program Manager
Christian Orlando
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Working Group Chair
William Travis

Other Activities From This Working Group

Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.


PC62.37

Standard for Test Methods and Preferred Values for Thyristor Surge Protective Components

This standard sets terms, test methods, test circuits, measurement procedures and preferred result values for silicon thyristor-based surge protective components used for overvoltage or overcurrent or both protection in low-voltage information technology communications system items. The thyristor variants covered are: Unidirectional characteristic Bidirectional characteristic Two terminal (diode) fixed voltage Three or more terminal gate controlled Integrated series diode types for low capacitance.

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PC62.38

Test Methods and preferred values for hybrid integrated circuit components containing gas discharge tube and metal oxide varistor technologies

This standard sets terms, test methods, test circuits, measurement procedures, and preferred result values for two-terminal hybrid integrated circuit surge protective components (SPCs) containing gas discharge tube and metal oxide varistor technologies connected either in series or parallel. These SPCs are used in the construction of surge protective devices (SPDs) and equipment used in Information & Communications Technologies, (ICT) networks with voltages up to AC 1000 V and DC 1500 V, to mitigate overvoltage surges. Series connected gas discharge tube and metal oxide varistor configurations are applicable for AC mains surge protection and the tests reflect this use. Parallel connected gas discharge tube and metal oxide varistor configurations are suited to communications line surge protection and the tests reflect this use. This standard contains information on -- terminology; -- letter symbols; -- graphical symbols; -- environments; -- essential ratings and characteristics; -- rating verification and characteristic measurement; -- mechanical requirements and identification; -- preferred values; -- qualification.

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Standards approved by the IEEE SA Standards Board that are within the 10-year lifecycle.


C62.33-2016

IEEE Standard for Test Methods and Performance Values for Metal-Oxide Varistor Surge Protective Components

Test methods and preferred values for metal-oxide varistor (MOV) surge protective components are covered in this standard and have the following main parameter ranges: packaging (leaded disc-type or surface mount), nominal varistor voltage (5 V to 1200 V), 8/20 surge current rating (10 A to 70 kA), and 8/20 clamping voltage (10 V to 3 kV). With appropriate component selection, these components could be used for the overvoltage protection of power and signal systems having continuous ac voltages (2.5 V rms to 750 V rms), steady-state dc voltages (3.3 V to 1000 V), and peak signal feed voltages (3.5 V to 850 V). Information is given on manufacturer type testing used to determine environmental performance and rated values.

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C62.59-2019

IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes

Supersedes IEEE C62.35-2010 and IEEE C62.35-2010/Cor1-2018. The basic electrical parameters to be met by silicon PN junction voltage clamping components used for the protection of telecommunications equipment or lines from surges are defined in this standard. It is intended that this standard be used for the harmonization of existing or future specifications issued by PN diode surge protective component manufacturers, telecommunication equipment manufacturers, administrations, or network operators.

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C62.69-2016

IEEE Standard for the Surge Parameters of Isolating Transformers Used in Networking Devices and Equipment

Terms, test methods, test circuits, measurement procedures, and preferred result values for the surge mitigation parameters of isolating transformers used in networking devices and equipment are set in this standard. Three types of isolating transformer are considered: mains low frequency power, high frequency power (switching mode power supplies) and signal (e.g., Ethernet data).

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C62.69a-2017

IEEE Standard for the Surge Parameters of Isolating Transformers used in Networking Devices and Equipment - Amendment 1: Addition of Saturated Core Secondary Winding Parameters

Added in this amendment is a new sub-clause, 4.5 Saturated core secondary winding parameters, to IEEE C62.69(TM)-2016. Test methods, test circuits, measurement procedures, and result treatment to determine the secondary winding resistance and saturated core inductance are given.

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These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.


C62.33-1982

IEEE Standard Test Specifications for Varistor Surge-Protective Devices

Varistors for surge-protective applications on systems with dc to 420 Hz frequency and voltages equal to or less than 1000 V rms, or 1200 V dc, are covered. Definitions, service conditions, and a series of test criteria for determining the electrical characteristics of the varistors are provided. The tests are intended as design tests and provide a means of comparing various surge-protective devices.

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C62.35-1987

IEEE Standard Test Specifications for Avalanche Junction Semiconductor Surge Protective Devices

A two-terminal avalanche junction surge suppressor for surge-protective application on systems with dc to 420-Hz frequency and voltages equal to or less than 1000 V rms or 1200 V dc is considered. The device is a single package that may be assembled from any combination of series and/or parallel diode chips. Definitions, service conditions, and a series of test criteria for determining its electrical characteristics are provided. These devices are used as surge diverters for limiting transient overvoltages in power and communications circuits.

Learn More About C62.35-1987

C62.35-2010

IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components

Superseded by C62.59-2019. Avalanche breakdown diodes used for surge protection in systems with voltages equal to or less than 1000 V rms or 1200 V dc are discussed in this standard. The avalanche breakdown diode surge suppressor is a semiconductor diode which can operate in either the forward or reverse direction of its V-I characteristic. This component is a single package, which may be assembled from any combination of series and/or parallel diode chips.

Learn More About C62.35-2010

C62.35-2010/Cor 1-2018

IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components--Corrigendum 1

Superseded by C62.59-2019. Avalanche breakdown diodes used for surge protection on systems with voltages equal to or less than 1000 V rms or 1200 V dc are discussed in this standard. The avalanche breakdown diode surge suppressor is a semiconductor diode that can operate in either the forward or reverse direction of its V-I characteristic. This component is a single package, which may be assembled from any combination of series and/or parallel diode chips. This standard contains definitions, service conditions, and a series of test criteria for determining the electrical characteristics and verifying ratings of these avalanche breakdown diodes. If the characteristics differ with the direction of conduction, then each direction of conduction shall be separately specified.

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C62.37.1-2000

IEEE Guide for the Application of Thyristor Surge Protective Devices

Applications information on fixed voltage and gated thyristor surge protective devices(SPDs) are provided. Key device parameters and their sensitivities are explained. Several worked telecommunication circuit design examples are given.

Learn More About C62.37.1-2000

These standards have been removed from active status through a ballot where the standard is made inactive as a consensus decision of a balloting group.


No Inactive-Withdrawn Standards

These standards are removed from active status through an administrative process for standards that have not undergone a revision process within 10 years.


C62.37-1996

IEEE Standard Test Specification for Thyristor Diode Surge Protective Devices

This standard applies to two or three terminal, four or five layer, thyristor surge protection devices (SPDs) for application on systems with voltages equal to or less than 1000 V rms or 1200 V dc.

Learn More About C62.37-1996

C62.37.1-2012

IEEE Guide for the Application of Thyristor Surge Protective Device Components

Applications information on fixed-voltage and gated-thyristor surge protective components (SPCs) is provided. Key device parameters and their sensitivities are explained. Several worked telecommunication circuit design examples are given.

Learn More About C62.37.1-2012

C62.39-2012

IEEE Standard for Test Methods and Preferred Values for Self-Restoring Current-Limiter Components Used in Telecommunication Surge Protection

The basic requirements to be met by series connected, solid-state, self-restoring overcurrent protectors (OCPs) for the protection of telecommunication equipment and lines are presented. This standard should be used for the harmonization of existing or future specifications issued by solid-state, self-restoring OCP manufacturers, telecommunication equipment manufacturers, administrations, or network operators.

Learn More About C62.39-2012

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