Active Standard

IEEE 7009-2024

IEEE Standard for Fail-Safe Design of Autonomous and Semi-Autonomous Systems

A practical, technical baseline of specific methodologies and tools for the development, implementation, and use of effective fail-safe mechanisms in autonomous and semi-autonomous systems is established in this standard. The standard serves as the basis for developers, as well as users and regulators, to design fail-safe mechanisms in a robust, transparent, and accountable manner.

Sponsor Committee
RS/SC - IEEE Reliability Society Standards Committee
Joint Sponsors
C/S2ESC
Status
Active Standard
PAR Approval
2017-06-15
Board Approval
2024-05-20
History
Published:
2024-07-05

Working Group Details

Society
IEEE Reliability Society
Learn More About IEEE Reliability Society
Sponsor Committee
RS/SC - IEEE Reliability Society Standards Committee
Working Group
Fail-Safe Design - Standard for Fail-Safe Design of Autonomous and Semi-Autonomous Systems
IEEE Program Manager
Christy Bahn
Contact Christy Bahn
Working Group Chair
Kenneth Wallace

Other Activities From This Working Group

Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.


No Active Projects

Standards approved by the IEEE SA Standards Board that are within the 10-year lifecycle.


No Active Standards

These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.


No Superseded Standards

These standards have been removed from active status through a ballot where the standard is made inactive as a consensus decision of a balloting group.


No Inactive-Withdrawn Standards

These standards are removed from active status through an administrative process for standards that have not undergone a revision process within 10 years.


No Inactive-Reserved Standards
Subscribe to our Newsletter

Sign up for our monthly newsletter to learn about new developments, including resources, insights and more.