Superseded Standard

ANSI/IEEE 300-1982

IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors

The object of this standard is to establish standard test procedures for semiconductor charged-particle detectors. These detectors are in wide-spread use for the detection and high resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. Not all tests described in this standard are mandatory, but tests which are used to specify performance shall be performed in accordance with the procedures described herein.

Status
Superseded Standard
Superseding
300-1969
Board Approval
1981-09-17
History
ANSI Approved:
1982-05-14
Published:
1992-11-10

Working Group Details

No Active Projects
No Active Standards
No Superseded Standards
No Inactive-Withdrawn Standards
No Inactive-Reserved Standards
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