Active PAR


Standard for System Test Access Management (STAM) to Enable Use of Sub-System Test Capabilities at Higher Architectural Levels

This standard addresses use/ reuse of test assets in system context by: 1) defining a representation for behavioral descriptions of pertinent sub-assembly interfaces and of relevant data and protocol transformations; 2) defining methods for utilizing such representations to enhance management of and access to said test assets. In conjunction with existing methods for test access and test management, this will allow the coordination and control of a variety of digital interfaces to devices, boards, and sub-systems to extend test access to board and system levels. This standard does not replace or provide an alternative to existing test interface standards, but aims instead to enable their usage throughout the hierarchy of systems.

Sponsor Committee
C/TT - Test Technology
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Active PAR
PAR Approval

Working Group Details

IEEE Computer Society
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Sponsor Committee
C/TT - Test Technology
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Working Group
STAM - System Test Access Management
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IEEE Program Manager
Tom Thompson
Working Group Chair
Ian Mcintosh

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