Superseded Standard

IEEE 1620-2004

Standard for Test Methods for the Characterization of Organic Transistors and Materials

This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.

Sponsor Committee
C/MSC - Microprocessor Standards Committee
Learn More About C/MSC - Microprocessor Standards Committee
Status
Superseded Standard
PAR Approval
2003-06-12
Superseded by
1620-2008
Board Approval
2004-02-09
History
ANSI Approved:
2004-05-12
Published:
2004-04-29

Working Group Details

Society
IEEE Computer Society
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Sponsor Committee
C/MSC - Microprocessor Standards Committee
Learn More About C/MSC - Microprocessor Standards Committee
Working Group
1620_WG - Working Group for Organic and Molecular Electronics
IEEE Program Manager
Tom Thompson
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Working Group Chair
Daniel Gamota

Other Activities From This Working Group

Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.


No Active Projects

Standards approved by the IEEE SA Standards Board that are within the 10-year lifecycle.


No Active Standards

These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.


No Superseded Standards

These standards have been removed from active status through a ballot where the standard is made inactive as a consensus decision of a balloting group.


No Inactive-Withdrawn Standards

These standards are removed from active status through an administrative process for standards that have not undergone a revision process within 10 years.


1620-2008

IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials

This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.

Learn More About 1620-2008

1620.1-2006

IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators

Recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators are covered. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators.

Learn More About 1620.1-2006

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