Active PAR

P1581

Standard for Static Component Interconnection Test Protocol and Architecture

This standard defines a low-cost method for testing the interconnection of discrete, complex memory integrated circuits (ICs) where additional pins for testing are not available and implementing boundary scan (IEEE Std 1149.1, IEEE Standard for Test Access Port and Boundary-Scan Architecture, https://standards.ieee.org/standard/1149_1-2013.html) is not feasible. This standard describes the implementation rules for the test logic and test mode access/exit methods in compliant ICs. The standard is limited to the behavioral description of the implementation and will not include the technical design for the test logic or test mode control circuitry.

Sponsor Committee
C/TT - Test Technology
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Status
Active PAR
PAR Approval
2020-09-24
Superseding
1581-2011

Working Group Details

Society
IEEE Computer Society
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Sponsor Committee
C/TT - Test Technology
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Working Group
SCIT1581 - Static Component Interconnection Test Protocol and Architecture Working Group
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IEEE Program Manager
Tom Thompson
Contact
Working Group Chair
Heiko Ehrenberg
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1581-2011

IEEE Standard for Static Component Interconnection Test Protocol and Architecture

IEEE Std 1581 defines a low-cost method for testing the interconnection of discrete, complex memory integrated circuits (ICs) where additional pins for testing are not available and implementing boundary scan (IEEE Std 1149.1(TM)) is not feasible. This standard describes the implementation rules for the test logic and test mode access/exit methods in compliant ICs. The standard is limited to the behavioral description of the implementation and will not include the technical design for the test logic or test mode control circuitry.

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No Superseded Standards
No Inactive-Withdrawn Standards
No Inactive-Reserved Standards
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