Active PAR

P1450.1

Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments

Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and Built-In Self-Test (BIST), and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.

Sponsor Committee
C/TT - Test Technology
Learn More About C/TT - Test Technology
Status
Active PAR
PAR Approval
2020-12-03
Superseding
1450.1-2005

Working Group Details

Society
IEEE Computer Society
Learn More About IEEE Computer Society
Sponsor Committee
C/TT - Test Technology
Learn More About C/TT - Test Technology
Working Group
STIL.1 - IEEE Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
Learn More About STIL.1 - IEEE Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
IEEE Program Manager
Tom Thompson
Contact Tom Thompson
Working Group Chair
Ric Dokken

Other Activities From This Working Group

Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.


No Active Projects

Standards approved by the IEEE SA Standards Board that are within the 10-year lifecycle.


No Active Standards

These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.


No Superseded Standards

These standards have been removed from active status through a ballot where the standard is made inactive as a consensus decision of a balloting group.


No Inactive-Withdrawn Standards

These standards are removed from active status through an administrative process for standards that have not undergone a revision process within 10 years.


No Inactive-Reserved Standards
Subscribe

Sign up for our monthly newsletter to learn about new developments, including resources, insights and more.