Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and Built-In Self-Test (BIST), and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Define structures in STIL to relate fail information from device testing environments back to original stimulus and design data elements.
- Sponsor Committee
- C/TT - Test Technology
Learn More About C/TT - Test Technology - Status
- Active PAR
- PAR Approval
- 2020-12-03
- Superseding
- 1450.1-2005
Working Group Details
- Society
- IEEE Computer Society
Learn More About IEEE Computer Society - Sponsor Committee
- C/TT - Test Technology
Learn More About C/TT - Test Technology - Working Group
-
STIL.1 - IEEE Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
Learn More About STIL.1 - IEEE Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments - IEEE Program Manager
- Tom Thompson
Contact Tom Thompson - Working Group Chair
- Ric Dokken
Other Activities From This Working Group
Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.
No Active Projects
Standards approved by the IEEE SA Standards Board that are within the 10-year lifecycle.
No Active Standards
These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.
No Superseded Standards
These standards have been removed from active status through a ballot where the standard is made inactive as a consensus decision of a balloting group.
No Inactive-Withdrawn Standards
These standards are removed from active status through an administrative process for standards that have not undergone a revision process within 10 years.
No Inactive-Reserved Standards