As a part of the family of IEEE ABBET(R) standards, this guide facilitates an understanding of the relationships of IEEE ABBET(R) 1226-1993 and its component standards, as well as the relationship of an ABBET implementation with the design, production, support, and operational environments with which it may be used.
- Standard Committee
- BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
- Status
- Inactive-Withdrawn Standard
- Board Approval
- 1996-04-15
- History
-
- Withdrawn:
- 2002-01-10
- Published:
- 1996-06-26
Working Group Details
- Society
- Standard Committee
- BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Other Activities From This Working Group
Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.
No Active Projects
Standards approved by the IEEE SA Standards Board that are within the 10-year lifecycle.
No Active Standards
These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.
No Superseded Standards
These standards have been removed from active status through a ballot where the standard is made inactive as a consensus decision of a balloting group.
No Inactive-Withdrawn Standards
These standards are removed from active status through an administrative process for standards that have not undergone a revision process within 10 years.
No Inactive-Reserved Standards