The services needed to access and manage descriptive information about resources in an automatic test system (ATS) are covered. This information includes data about the automatic test equipment (ATE) instruments, switching, and the test subject adapter. This standard is a com-ponent of the ABBET set of standards.
- Standard Committee
- BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
- Status
- Inactive-Withdrawn Standard
- Board Approval
- 1998-03-26
- History
-
- Withdrawn:
- 2004-01-16
- Published:
- 1998-06-02
Working Group Details
- Society
- Standard Committee
- BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Other Activities From This Working Group
Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.
No Active Projects
Standards approved by the IEEE SA Standards Board that are within the 10-year lifecycle.
No Active Standards
These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.
No Superseded Standards
These standards have been removed from active status through a ballot where the standard is made inactive as a consensus decision of a balloting group.
No Inactive-Withdrawn Standards
These standards are removed from active status through an administrative process for standards that have not undergone a revision process within 10 years.
No Inactive-Reserved Standards