IEEE IRE28.S2-1956 - IRE Standards on Solid State Devices: Methods of Testing Transistors, 1956
Standard Details
This standard deals with the methods of measurement of important characteristics of transistors. In general, these characteristics are referred to as parameters of the devices. Because of the youthfulness of the transistor art, methods of testing transistors will continue to change considerably before the art can be considered to have stabilized sufficiently for complete standardization. This standard corresponds to the current state of transistor testing methods, and its publication by the IRE is considered preferable to waiting for a future stabilization of the many rapid changes now characteristic of this field
Status
Board Approval
Additional Resources Details
Pars
Working Group Details