Active Standard

IEEE C37.26-2014

IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage (1000 V AC or lower) Inductive Test Circuits

Methods for determining the value of the power factor for inductive low-voltage (1000 V ac and lower) test circuits are provided. These methods are used in determining the power factor during short-circuit current tests in high-power laboratories. It is preferred that these methods be used during short-circuit current testing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used shall have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuits (under 1000 V ac) but may also be used for higher voltages.

Sponsor Committee
PE/SWG - Switchgear
Learn More About PE/SWG - Switchgear
Status
Active Standard
PAR Approval
2014-03-27
Superseding
C37.26-2003
Board Approval
2014-08-21
History
Published:
2014-10-03

Working Group Details

Society
IEEE Power and Energy Society
Learn More About IEEE Power and Energy Society
Sponsor Committee
PE/SWG - Switchgear
Learn More About PE/SWG - Switchgear
Working Group
LVSD/C37.26 - C37.26 - IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits
IEEE Program Manager
Jennifer Santulli
Contact Jennifer Santulli
Working Group Chair
T W Olsen

Other Activities From This Working Group

Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.


No Active Projects

Standards approved by the IEEE SA Standards Board that are within the 10-year lifecycle.


No Active Standards

These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.


C37.26-2003

IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits

This guide provides methods for determining the value of power factor for inductive low-voltage (1000 volts ac and below) test circuits. These methods are used in determining power factor during short-circuit current tests in high power laboratories. It is preferred that these methods be used during short-circuit current testing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used must have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuits (under 1000 volts ac), but may also be used for higher voltages.

Learn More About C37.26-2003

These standards have been removed from active status through a ballot where the standard is made inactive as a consensus decision of a balloting group.


No Inactive-Withdrawn Standards

These standards are removed from active status through an administrative process for standards that have not undergone a revision process within 10 years.


No Inactive-Reserved Standards
Subscribe to our Newsletter

Sign up for our monthly newsletter to learn about new developments, including resources, insights and more.