This guide has been written as an applications manual for engineers and authors who will be writing test procedures in ATLAS (Abbreviated Test Language for All Systems). It is not intended to be a substitute for an instruction manual in the ATLAS language, but, rather, a practical extension to such a manual. The purpose is to provide principles of good practice in the use of ATLAS for the writing of test procedures.
- Sponsor Committee
- BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Learn More About BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems - Status
- Inactive-Withdrawn Standard
- Superseded by
- 771-1998
- Superseding
- 771-1984
- Board Approval
- 1989-08-17
- History
-
- Withdrawn:
- 1996-10-25
- ANSI Approved:
- 1990-01-12
- Published:
- 1989-11-20
Working Group Details
- Society
- IEEE SA Board of Governors
- Sponsor Committee
- BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Learn More About BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
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