IEEE 62528-2007 - IEC 62528 Ed. 1 (IEEE Std 1500(TM)-2005): Standard Testability Method for Embedded Core-based Integrated Circuits
Standard Details
Replaced IEEE Std 1500-2005. This standard defines a mechanism for the test of core designs within a system on chip(SoC). This mechanism constitutes a hardware architecture and leverages the core test language(CTL) to facilitate communication between core designers and core integrators.
Sponsor Committee
Status
History
Additional Resources Details
PAR
Working Group Details
Sponsor Committee
Society
IEEE Program Manager