IEEE 517-1974 - IEEE Standard Specification Format Guide and Test Procedure for Single-Degree-of-Freedom Rate-Integrating Gyros

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Standard Details

A specification format guide for the preparation of a rate-integrating gyro specification that provides a common meeting ground of terminology and practice for manufacturers and users is presented. A compilation of recommended procedures for testing a rate-integrating gyro is given.

Standards Committee	AES/GA - Gyro Accelerometer Panel
Status	Inactive-Reserved
Board Approval	1973-12-13
History	Published Date:1974-10-17 Reaffirmed:2010-09-30 Withdrawn Date:2021-03-25

Additional Resources Details

Errata

517-1974_errata.pdf

Working Group Details

Working Group	SENSR_WG - Sensors Working Group
Working Group Chair	Harry Davis
Standards Committee	AES/GA - Gyro Accelerometer Panel
Society	IEEE Aerospace and Electronic Systems Society
IEEE Program Manager	Ashley Moran
Existing Standards	Inactive-Reserved IEEE 292-1969 - IEEE Specification Format for Single-Degree-of-Freedom Spring-Restrained Rate Gyros This specification defines the requirements for a single-degree-of-freedom spring-restrained rate gyro for [aircraft, missile, spacecraft,______] applications. The rate gyro shall be capable of providing [(dc, ac) voltage outputs proportional to angular rate inputs up to______ degrees per second, a switch closure(s) at angular rates (exceeding,less than)______ (+,-,?)______ degrees per second].
	Inactive-Reserved IEEE 293-1969 - IEEE Test Procedure for Single-Degree-of-Freedom Spring-Restrained Rate Gyros Recommended rate gyro test procedures derived from those currently in use, including test conditions to be considered, are compiled. In some cases alternate methods for measuring a performance characteristic have been included. This standard is intended to be a guide in the preparation of Section 4 of a specification that follows the format of IEEE Std 292, Specification Format for Single-Degree-of-Freedom Spring-Restrained Rate Gyros.
	Inactive-Reserved IEEE 529-1980 - Supplement for Strapdown Applications to IEEE Standard Specification Format Guide and Test Procedure for Single-Degree-of-Freedom Rate-Integrating Gyros A specification format guide for the preparation of a rate-integrating gyroscope specification is presented. Recommended procedures for testing a rate-integrating gyroscope are compiled. This standard, when combined with IEEE Std 517-1974 (R1980), defines the requirements and test procedures in terms of characteristics unique to the gyroscope or those applications in which the dynamic angular inputs are significantly greater than the limitations identified in IEEE Std 517.
	Inactive-Reserved IEEE 293-1969/Cor 1-2014 - IEEE Standard for IEEE Test Procedure for Single-Degree-of-Freedom Spring-Restrained Rate Gyros -- Corrigendum 1: Table 1 Heading Correction to Table 1 on page 14 of IEEE Std 293-1969
	Inactive-Reserved IEEE 529-1980/Cor 1-2017 - IEEE Standard Supplement for Strapdown Applications to IEEE Standard Specification Format Guide and Test Procedure for Single-Degree-of-Freedom Rate-Integrating Gyros - Corrigendum 1: 3.3.9.2.2, 3.6.4.1.1, 3.6.4.1.2, 6.3, and 10.10.4.1 Corrections are made by this corrigendum to material already published in IEEE Std 529-1980.