This standard defines how the necessary information is passed from scan insertion to pattern generation and from pattern generation to diagnosis such that different tool vendors could be used for each step independent of on-chip scan compression logic used.
- Sponsor Committee
- C/TT - Test Technology
Learn More About C/TT - Test Technology - Status
- Inactive-Reserved Standard
- PAR Approval
- 2007-02-27
- Board Approval
- 2009-05-13
- History
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- ANSI Approved:
- 2009-11-09
- Published:
- 2009-07-13
- Inactivated Date:
- 2020-03-05
Working Group Details
- Society
- IEEE Computer Society
Learn More About IEEE Computer Society - Sponsor Committee
- C/TT - Test Technology
Learn More About C/TT - Test Technology - Working Group
-
OCI - Standard For Describing On-chip Scan Compression
- IEEE Program Manager
- Tom Thompson
Contact Tom Thompson - Working Group Chair
- Bruce Cory
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