The testability structure for digital circuits described in IEEE Std 1149.1-1990 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration.
- Sponsor Committee
- C/TT - Test Technology
Learn More About C/TT - Test Technology - Status
- Superseded Standard
- Superseded by
- 1149.4-2010
- Board Approval
- 1999-06-26
- History
-
- ANSI Approved:
- 1999-11-18
- Published:
- 2000-03-20
Working Group Details
- Society
- IEEE Computer Society
Learn More About IEEE Computer Society - Sponsor Committee
- C/TT - Test Technology
Learn More About C/TT - Test Technology - Working Group
-
1149.4WG - Mixed-Signal Test Bus Working Group
- IEEE Program Manager
- Tom Thompson
Contact Tom Thompson - Working Group Chair
- Bambang Suparjo
Other Activities From This Working Group
Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.
P1149.4
Standard for a Mixed-Signal Test Bus
This standard defines a mixed-signal test bus architecture that provides the means of control and access to both analog and digital test signals such that the testability structure for digital circuits described in IEEE Std 1149.1-2013 has been extended effectively to provide similar facilities for mixed-signal circuits. In addition to testing of interconnections in the conventional sense of IEEE Std 1149.1-2013, the mixed-signal test bus defined by this standard also provides the means for parametric testing and, optionally, the means to access internal test structures. The standard does not mandate implementation details of the test circuitry, although examples of conformant implementations are given for illustration. Further, the standard develops extensions to Boundary-Scan Description Language (BSDL) as a means of describing key aspects of the implementation of this standard within a particular component. At present, the extensions to BSDL defined by this standard specifically omit the description of any and all analog parameters defined by the standard.
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These standards are removed from active status through an administrative process for standards that have not undergone a revision process within 10 years.
1149.4-2010
IEEE Standard for a Mixed-Signal Test Bus
The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to, both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration. Also, extensions to the standard BSDL are defined that allow description of key component-specific aspects of such testability features.