IEEE 1005-1998 - IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays
Standard Details
This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E 2 PROMs, and block rewritableflash EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance,and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.
Sponsor Committee
Status
Board Approval
History
Additional Resources Details
Pars
Historical Base Standard
Working Group Details
Sponsor Committee
Society
IEEE Program Manager