P1696 - Standard for Terminology and Test Methods for Circuit Probes
Project Details
This standard provides test method(s) and describes transfer (artifact) standards for characterizing electrical circuit probes and probes systems. The systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe includes the mechanism by which the circuit is contacted. This method and standard applies to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance greater than the impedance of the circuit under test.
Sponsor Committee
Par Approval
Additional Resources Details
Historical Base Standard
Working Group Details
Working Group
Sponsor Committee
IEEE Program Manager
Existing Standards