Inactive-Reserved Standard

IEEE 1641-2010

IEEE Standard for Signal and Test Definition

This standard provides the means to define and describe signals used in testing. It also provides a set of common basic signals, built upon formal mathematical specifications so that signals can be combined to form complex signals usable across all test platforms. This standard contains additional downloads at http://standards.ieee.org/downloads/1641/1641-2010

Sponsor Committee
SASB/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
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Status
Inactive-Reserved Standard
PAR Approval
2008-06-12
Superseding
1641-2004
Board Approval
2010-06-17
History
Published:
2010-09-17
Inactivated Date:
2021-03-25

Additional Resources

Downloads
1641-2010_downloads.zip

Working Group Details

Society
IEEE-SASB Coordinating Committees
Sponsor Committee
SASB/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
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Working Group
TAD_WG - Test and ATS Description Working Group
IEEE Program Manager
Christian Orlando
Contact
Working Group Chair
Ion Neag

P1641

IEEE Draft Standard for Signal and Test Definition

This standard provides the means to define and describe signals used in testing. It also provides a set of common basic signals, built upon formal mathematical specifications so that signals can be combined to form complex signals usable across all test platforms.

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1641.1-2013

IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition

Guidance in the use of the signal and test definition (STD) standard, IEEE Std 1641-2010, is provided. IEEE Std 1641 provides the means to define and describe signals used in testing. This guide describes how to form complex signals usable across all test platforms.

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1641.1a-2018

IEEE Guide for the Use of IEEE Std 1641(TM), IEEE Standard for Signal and Test Definition Amendment 1: Addition of Guidelines for Producing Reusable Test Signal Frameworks for Use on Platforms Utilizing Automatic Test Markup Language

Amend the guide to add guidelines for producing reusable TSFs for use on platforms utilizing ATML, and produce example TSFs showing conformance with the guidelines. This guide explains how signal definitions and test requirements may be implemented in conformance with IEEE Std 1641-2010. It also provides background information, tutorial support, and examples of signal definitions and test requirements for users of the standard. TSFs are major component for adhering with the IEEE Std 1641. There is little guidance in helping users create their own reusable TSFs or examples that show good practices to copy.

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1671.1-2017

IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions

An exchange format, utilizing Extensible Markup Language (XML), for both the static description of unit under test (UUT), and the specific description of UUT instance information is defined in this standard.

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1671.3-2017

IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description

An exchange format utilizing Extensible Markup Language (XML) for both the static description of unit under test (UUT) and the specific description of UUT instance information is defined in this standard.

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716-1995

IEEE Standard Test Language for All Systems - Common/Abbreviated Test Language for All Systems (C/ATLAS)

A high order language for testing is defined. This language is designed to describe tests in terms that are independent of any specific test system, and has been constrained to ensure that it can be implemented on automatic test equipment.

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1641.1-2006

IEEE Guide for the Use of IEEE Std 1641, Standard for Signal and Test Definition

Guidance in the use of the signal and test definition (STD) standard is provided. STD provides the means to define and describe signals used in testing. This guide describes how to implement, apply, and use a set of common basic signals to form complex signals usable across all test platforms.

Learn More

1671.1-2009

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions

This document specifies an exchange format, using the extensible Markup Language (XML), for exchanging the test description information defining test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a Unit Under Test (UUT). This is in support of the development of Test Program Sets (TPSs) that will be used in an automatic test environment.

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No Inactive-Withdrawn Standards

771-1998

IEEE Guide to the Use of the ATLAS Specification

Guidance in the use of ATLAS test languages is provided. ATLAS may be used to de- scribe test requirements independent of any specific test equipment, and examples of best practice in the use of ATLAS are given.

Learn More

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