Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.
- Sponsor Committee
- C/TT - Test Technology
Learn More - Status
- Inactive-Reserved Standard
- PAR Approval
- 1996-06-20
- Board Approval
- 1999-03-18
- History
-
- ANSI Approved:
- 1999-11-16
- Published:
- 1999-09-01
- Reaffirmed:
- 2011-06-16
- Inactivated Date:
- 2022-03-24
Working Group Details
- Society
- IEEE Computer Society
Learn More - Sponsor Committee
- C/TT - Test Technology
Learn More - Working Group
-
STIL_WG - Standard Test Interface Language Working Group
Learn More - IEEE Program Manager
- Tom Thompson
Contact - Working Group Chair
- Ric Dokken
P1450
Standard Test Interface Language (STIL) for Digital Test Vector Data
This standard defines a test description language that: a) Facilitates the transfer of large volumes of digital test vector data from computer-aided engineering (CAE) environments to automated test equipment (ATE) environments; b) Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); c) Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.
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