Inactive-Reserved Standard

IEEE 1450-1999

IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data

Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.

Sponsor Committee
C/TT - Test Technology
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Status
Inactive-Reserved Standard
PAR Approval
1996-06-20
Board Approval
1999-03-18
History
ANSI Approved:
1999-11-16
Published:
1999-09-01
Reaffirmed:
2011-06-16
Inactivated Date:
2022-03-24

Working Group Details

Society
IEEE Computer Society
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Sponsor Committee
C/TT - Test Technology
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Working Group
STIL_WG - Standard Test Interface Language Working Group
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IEEE Program Manager
Tom Thompson
Contact
Working Group Chair
Ric Dokken

P1450

Standard Test Interface Language (STIL) for Digital Test Vector Data

This standard defines a test description language that: a) Facilitates the transfer of large volumes of digital test vector data from computer-aided engineering (CAE) environments to automated test equipment (ATE) environments; b) Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); c) Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.

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No Inactive-Reserved Standards
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