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Instrumentation and Measurement Standards

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Instrumentation and Measurement Standards
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660-1986 - IEEE Standard for Semiconductor Memory Test Pattern LanguageThe purpose of this standard is to establish a common language for describing functional tests of memory devices. That language definiti ... withdrawn Standard
662-1992 - IEEE Standard Terminology for Semiconductor MemoryGuidelines under which data sheets for new semiconductor memories are to be generated are provided. Adherence to these guidelines is int ... withdrawn Standard
716-1995 - IEEE Standard Test Language for All Systems - Common/Abbreviated Test Language for All Systems (C/ATLAS)A high order language for testing is defined. This language is designed to describe tests in terms that are independent of any specific ... active Standard
746-1984 - IEEE Standard for Performance Measurements of A/D and D/A Converters for PCM Television Video CircuitsThis standard describes methods for measuring ther performance of uniformly coded alnalog-to-digital (A/D) coverters and digital-to-anal ... withdrawn Standard
748-1979 - IEEE Standard for Spectrum AnalyzersWithdrawn Standard. This standard applies to frequenct scanning spectrum analyzers. withdrawn Standard
771-1989 - IEEE Guide to the Use of the ATLAS SpecificationSuperseded. This guide has been written as an applications manual for engineers and authors who will be writing test procedures in ATLA ... withdrawn Standard
790-1989 - IEEE Guide for Medical Ultrasound Field Parameter MeasurementsWithdrawn Standard. Withdrawn Date: Jan 10, 2002. No longer endorsed by the IEEE. This standard describes procedures for measuring ultr ... withdrawn Standard
844.1/CSA C22.2 No.293.1-2017 - IEEE/CSA Standard for Skin Effect Trace Heating of Pipelines, Vessels, Equipment, and Structures - General, Testing, Marking, and Documentation RequirementsGeneral requirements, testing, markings, and documentation for skin effect trace heating systems for pipelines, vessels, equipment, and ... active Standard
1057-1989 - IEEE Trial-Use Standard for Digitizing Waveform Recorders"The purpose of this trial-use standard is to provide common terminology and test methods for describing the performance of waveform rec ... withdrawn Standard
1057-2017 - IEEE Standard for Digitizing Waveform RecordersTerminology and test methods for describing the performance of waveform recorders are presented in this standard. active Standard
1122-1998 - IEEE Standard for Digital Recorders for Measurements in High-Voltage Impulse TestsReaffirmed September 2007. Instructions are given for conducting and reporting the more generally applicable and acceptable tests to det ... active Standard
1139-1988 - IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time MetrologyMethods of describing random instabilities of importance to frequency and time metrology is covered in this standard. Quantities covered ... withdrawn Standard
1139-2008 - IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology--Random InstabilitiesMethods of describing random instabilities of importance to frequency and time metrology are covered in this standard. Quantities cover ... active Standard
1149.1-2013 - IEEE Standard for Test Access Port and Boundary-Scan ArchitectureCircuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit board ... active Standard
1149.4-2010 - IEEE Standard for a Mixed-Signal Test BusThe testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mix ... active Standard
1149.6-2015 - IEEE Standard for Boundary-Scan Testing of Advanced Digital NetworksIEEE Std 1149.1(TM) is augmented by this standard to improve the ability for testing differential and/or ac-coupled interconnections bet ... active Standard
1149.7-2009 - IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan ArchitectureThis specification describes circuitry that may be added to an integrated circuit to provide access to on-chip Test Access Ports (TAPs) ... active Standard
1149.8.1-2012 - IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active ComponentsExtensions to IEEE Std 1149.1(TM) that define the boundary-scan structures and methods required to facilitate boundary-scan-based stimul ... active Standard
1149.10-2017 - IEEE Standard for High-Speed Test Access Port and On-Chip Distribution ArchitectureCircuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boar ... active Standard
1174-2000 - IEEE Standard Serial Interface for Programmable InstrumentationThis project defines a serial, full-duplex, asynchronous, 9-pin DTE communications port that follows EIA 574 and related standards. Port ... active Standard
1193-2003 - IEEE Guide for Measurement of Environmental Sensitivities of Standard Frequency GeneratorsStandard frequency generators that include all atomic frequency standards and precision quartz crystal oscillators are addressed. active Standard
1226-1998 - IEEE Standard for a Broad-Based Environment for Test (ABBET™), Overview and ArchitectureWithdrawn Standard. Withdrawn Date: Jan 16, 2004. The overall concept of A Broad-Based Environment for Test (ABBET) TM is defined, andm ... withdrawn Standard
1232-2010 - IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)Data interchange and standard software services for test and diagnostic environments are defined by Artificial Intelligence Exchange and ... active Standard
1232.3-2014 - IEEE Guide for the Use of Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)Guidance to developers of IEEE Std 1232-conformant applications is provided in this guide. A simple doorbell is used as an example syste ... active Standard
1241-2010 - IEEE Standard for Terminology and Test Methods for Analog-to-Digital ConvertersThe material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of ana ... active Standard
1332-2012 - IEEE Standard Reliability Program for the Development and Production of Electronic ProductsA standard set of reliability program objectives for use between customers and producers, or within product development teams, to expres ... active Standard
1377-1997 - IEEE Standard for Utility Industry End Device Data TablesFunctionally related utility application data elements, grouped into a single data structurefor transport are described. Data may be uti ... withdrawn Standard
1377-2012 - IEEE Standard for Utility Industry Metering Communication Protocol Application Layer (End Device Data Tables)Common structures are provided in this standard for encoding data in communication between End Devices (meters, home appliances, IEEE 17 ... active Standard
1413-2010 - IEEE Standard Framework for Reliability Prediction of HardwareThe framework for the reliability prediction for electronic hardware is covered in this standard. This standard identifies required elem ... active Standard
1413.1-2002 - IEEE Guide for Selecting and Using Reliability Predictions Based on IEEE 1413 framework for reliability prediction procedures for electronic equipment at all levels is provided in this guide . active Standard
1445-2016 - IEEE Standard for Digital Test Interchange Format (DTIF)The information content and the data formats for the interchange of digital test program data between digital automated test program gen ... active Standard
1450.1-2005 - IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design EnvironmentsReplaced by IEC 62526 Ed. 1 (2007-11).Standard Test Interface Language (STIL) provides an interface between digital test generation tool ... active Standard
1450.3-2007 - IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target SpecificationThe STIL environment supports transferring tester-independent test programs to a specific ATE system. Although native STIL data are test ... active Standard
1450.4-2017 - IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Test Flow SpecificationIEEE Std 1450-1999, which specifies the Standard Test Interface Language (STIL), is extended by this standard to provide an interface be ... active Standard
1450.6-2006 - IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)The Core Test Language (CTL) is a language created for a System-on-Chip flow (or SoC flow), where a design created by one group is reuse ... active Standard
1450.6.1-2009 - IEEE Standard for Describing On-Chip Scan CompressionThis standard defines how the necessary information is passed from scan insertion to pattern generation and from pattern generation to d ... active Standard
1450.6.2-2014 - IEEE Standard for Memory Modeling in Core Test LanguageReuse of test data and test structures developed for individual cores (designs) when integrated into larger integrated circuits is requi ... active Standard
1451.0-2007 - IEEE Standard for a Smart Transducer Interface for Sensors and Actuators - Common Functions, Communication Protocols, and Transducer Electronic Data Sheet (TEDS) FormatsIt defines the functions that are to be performed by a transducer interface module (TIM) and the common characteristics for all devices ... active Standard
1451.1-1999 - IEEE Standard for a Smart Transducer Interface for Sensors and Actuators - Network Capable Application Processor Information ModelThis standard defines an object model with a network-neutral interface for connecting processors to communication networks, sensors, and ... active Standard
1451.2-1997 - IEEE Standard for a Smart Transducer Interface for Sensors and Actuators - Transducer to Microprocessor Communication Protocols and Transducer Electronic Data Sheet (TEDS) FormatsA digital interface for connecting transducers to microprocessors is deÞned. A TEDS and its data formats are described. An electrical i ... active Standard