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IEEE STANDARD

1445-1998 - IEEE Standard for Digital Test Interchange Format (DTIF)

Description: The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This information can be broadly grouped into data that defines the following: the UUT (unit under test) model, stimulus and response, the fault dictionary, and probes.
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