Inactive-Reserved Standard

IEEE 1720-2012

IEEE Recommended Practice for Near-Field Antenna Measurements

Near-field test practices for the measurement of antenna properties are described in this document and near-field measurement practices for the three principal geometries: cylindrical, planar, and spherical are recommended. Measurement practices for the calibration of probes used as reference antennas in near-field measurements are also recommended.

Sponsor Committee
APS/SC - Antennas and Propagation Standards Committee
Learn More About APS/SC - Antennas and Propagation Standards Committee
Status
Inactive-Reserved Standard
PAR Approval
2007-05-07
Board Approval
2012-08-30
History
Published:
2012-12-05
Inactivated Date:
2023-03-30

Working Group Details

Society
IEEE Antennas and Propagation Society
Learn More About IEEE Antennas and Propagation Society
Sponsor Committee
APS/SC - Antennas and Propagation Standards Committee
Learn More About APS/SC - Antennas and Propagation Standards Committee
Working Group
1720 - Near-Field Antenna Measurements
IEEE Program Manager
Tom Thompson
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Working Group Chair
Lars Foged

Other Activities From This Working Group

Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.


P1720

Recommended practice for near field antenna measurements

This document describes near-field test practices for the measurement of antenna properties. It is written for the person responsible or otherwise involved in operating the test system. It recommends procedures for testing and documenting the quality of the near field system, for calibration of the system, for carrying out the antenna measurements, and for delivering the measurement data in a useful format to the end user. The document defines useful antenna metrics, describes different types of test ranges with a brief introduction to the theory and equipment used. It reviews methods of characterising and operating antenna measurement ranges. Issues related to uncertainty analysis, anechoic chamber layout, probe calibration, full probe compensation, echo reduction techniques and use of non-orthogonal expansion functions in the Near-Field to Far-Field transformation are also discussed.

Learn More About P1720

Standards approved by the IEEE SA Standards Board that are within the 10-year lifecycle.


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