IEEE Std 1262-1995 IEEE Recommended Practice for Qualification of Photovoltaic (PV) Modules -Description

Abstract: Recommended procedures and specifications for qualification tests that are structured to evaluate terrestrial flat-plate photovoltaic non-concentrating modules intended for power generation applications are established.

Keywords: amorphous silicon devices, bypass diode thermal test, crystalline devices, damp heat test, dry hipot test, dynamic load test, electrical isolation test, electrical performance test, ground-continuity test, hail-impact test, hot-spot endurance test, humidity-freeze cycle test, mechanical loading test, outdoor exposure test, photovoltaic (PV) module, power generation, qualification test report, static load test, surface-cut susceptibility test, thermal-cycle test, twist test, ultraviolet conditioning test, visual inspection, wet hipot test, wet insulation-resistance test

Content

• 1. Overview
• • 1.1 Scope
  • 1.2 Purpose
  • 1.3 Limitations
• 2. References
• 3. Background and overview of qualification test
• • 3.1 Background
  • 3.2 Overview of qualification test
• 4. Module test and evaluation requirements
• • 4.1 Test specimens
  • 4.2 Initial tests and inspections
  • • 4.2.1 Allocation of modules to test sequences
  • 4.3 Final tests and inspections
  • 4.4 Evaluation of qualification test results
  • • 4.4.1 Initial tests and inspections
    • 4.4.2 Requirements, sequences A through E
    • 4.4.3 Special test requirements
    • 4.4.4 Requirements, final tests, and inspections
    • 4.4.5 Reporting requirements
• 5. Module test and inspection procedures
• • 5.1 Visual inspection procedure
  • • 5.1.1 Baseline visual inspection
    • 5.1.2 Intermediate visual inspections
    • 5.1.3 Final visual inspection
  • 5.2 Electrical-performance test
  • 5.3 Ground-continuity test
  • 5.4 Electrical-isolation test (dry hipot)
  • 5.5 Wet insulation-resistance test
  • 5.6 Electrical-isolation test (wet hipot)
  • 5.7 Thermal-cycle test
  • 5.8 Humidity-freeze cycle test
  • 5.9 Robustness of terminations
  • 5.10 Twist test
  • 5.11 Mechanical-loading tests
  • • 5.11.1 Static-load test
    • 5.11.2 Dynamic-load test
  • 5.12 Surface-cut susceptibility test
  • 5.13 Damp heat test
  • 5.14 Hail-impact test
  • 5.15 Bypass-diode thermal test
  • • 5.15.1 Non-intrusive bypass-diode thermal test
    • 5.15.2 Intrusive bypass-diode thermal test
  • 5.16 Hot-spot endurance test
  • • 5.16.1 Non-intrusive hot-spot test
    • 5.16.2 Intrusive hot-spot test
  • 5.17 Ultraviolet conditioning test
  • 5.18 Outdoor exposure test
  • 5.19 Annealing procedure
• 6. Bibliography
• Annex A A suggested test circuit for detecting open circuit and ground fault conditions
• Annex B Sample module qualification test report form

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