IEEE Std 1620™-2004 IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials -Description

Abstract: Recommended methods and standardized reporting practices for electrical characterization of organic transistors are covered. Due to the nature of organic transistors, significant measurement errors can be introduced if not properly addressed. This standard describes the most common sources of measurement error, and gives recommended practices in order to minimize and/or characterize the effect of each.

Keywords: field-effect transistor, organic electronic technology, organic materials, organic transistors, organic semiconductor technology, polymer field-effect transistor

Content

• 1. Overview
• • 1.1 Scope
  • 1.2 Purpose
  • 1.3 Electrical characterization overview
  • • 1.3.1 Testing apparatus
    • 1.3.2 Measurement techniques
    • 1.3.3 Repeatability and reporting sample size
    • 1.3.4 Application of low-noise techniques
• 2. Definitions, abbreviations, and acronyms
• • 2.1 Definitions
  • 2.2 Abbreviations and acronyms list
• 3. Standard OFET characterization procedures
• • 3.1 Device structures
  • 3.2 Guidelines for the OFET characterization process
  • 3.3 Electrical standards
  • • 3.3.1 Reasons for and results from each measurement type
    • 3.3.2 Bias stress effects and other directionally dependent phenomena
    • 3.3.3 Problems with slow polarization of dielectrics
  • 3.4 Reporting data
  • • 3.4.1 Minimum reporting standards
    • 3.4.2 Determination and reporting of device mobility
    • 3.4.3 Determination and reporting of on/off ratio
    • 3.4.4 Determination and reporting of dielectric constant
    • 3.4.5 Reporting of environmental conditions
    • 3.4.6 Other reportable parameters
  • 3.5 Environmental control and standards
• Annex A Bibliography

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