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Instrumentation and Measurement Standards

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Instrumentation and Measurement Standards
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416-1984 - IEEE Standard ATLAS Test LanguageThis standard defines ATLAS, the Abbreviated Test Language for All Systems, which offers a standardized test language for expressing tes ... withdrawn Standard
451-1955 - AIEE Proposed Recommended Guide for Sepecification of Signal SourcesThe purpose of these specifications is to give a common basis for comparison among signal sources used for test purposes. It is recommen ... withdrawn Standard
454-1973 - IEEE Recommended Practice for the Detection and Measurement of Partial Discharges (Corona) During Dielectric TestsThis document is based on IEC Publication 270-1968, Partial Discharge Measurements. adheres closely to the IEC recommendations with the ... active Standard
460-1988 - IEEE Standard for Electrical Measuring Transducer for Converting AC Electrical Quantities into DC Electrical QuantitiesThis standard applies to measuring transducers used for converting AC electrical quantities such as current, voltage, power (active or r ... withdrawn Standard
470-1972 - IEEE Standard Application Guide for Bolometric Power MetersWithdrawn Standard. Withdrawn Date: Dec 06, 1990. This standard applies to bolometric power meters as complete instruments and to their ... withdrawn Standard
474-1973 - IEEE Standard Specifications and Test Methods for FIxed and Variable Attenuators, DC-40 GHzThis performance standard covers absorptive and reflective attenuators, both fixed as well as continuously variable or variable in fixed ... withdrawn Standard
488-1978 - IEEE Standard Digital Interface for Programmable InstrumentationThe basic functional specifications of this standard may be used in digital interface applications which require longer distances, more ... superseded Standard
488.1-1987 - IEEE Standard Digital Interface for Programmable InstrumentationSuperseded by 488.1-2003. Interface systems used to interconnect both programmable and nonprogrammable electronic measuring apparatus w ... superseded Standard
488.1-2003 - IEEE Standard For Higher Performance Protocol for the Standard Digital Interface for Programmable InstrumentationThis standard applies to interface systems used to interconnect both programmable and nonprogrammable electronic measuring apparatus wit ... active Standard
488.2-1992 - IEEE Standard Codes, Formats, Protocols, and Common Commands for Use With IEEE Std 488.1-1987, IEEE Standard Digital Interface for Programmable InstrumentationA set of codes and formats to be used by devices connected via the IEEE 488.1 bus is specified. This standard also defines communication ... active Standard
488.2-1992 - IEEE Standard Codes, Formats, Protocols, and Common Commands For Use with ANSI/IEEE Std 488.1-1987 IEEE Standard Digital Interface for Programmable InstrumentationA set of codes and formats to be used by devices connected via the IEEE 488.1 bus is specified. This standard also defines communication ... superseded Standard
515-2017 - IEEE Standard for the Testing, Design, Installation, and Maintenance of Electrical Resistance Trace Heating for Industrial ApplicationsSpecific testing requirements for qualifying electrical resistance trace heating for use in industrial applications in ordinary location ... active Standard
544-1975 - IEEE Standard for Electrothermic Power MetersWithdrawn Standard. Withdrawn Date: Dec 06, 1990. This standard applies to electrothermic power meters as complete instruments and to th ... withdrawn Standard
586-1980 - IEEE Standard Definitions of Laser-Maser Termsno abstract. Withdrawn Standard. Withdrawn Date: Dec 06, 1990. withdrawn Standard
660-1986 - IEEE Standard for Semiconductor Memory Test Pattern LanguageThe purpose of this standard is to establish a common language for describing functional tests of memory devices. That language definiti ... withdrawn Standard
662-1980 - IEEE Standard Terminology for Semiconductor MemoryThe purpose of this standard is to provide guidelines under which data sheets for new semiconductor memories are to be generated. Adhere ... superseded Standard
662-1992 - IEEE Standard Terminology for Semiconductor MemoryGuidelines under which data sheets for new semiconductor memories are to be generated are provided. Adherence to these guidelines is int ... withdrawn Standard
716-1995 - IEEE Standard Test Language for All Systems - Common/Abbreviated Test Language for All Systems (C/ATLAS)A high order language for testing is defined. This language is designed to describe tests in terms that are independent of any specific ... active Standard
746-1984 - IEEE Standard for Performance Measurements of A/D and D/A Converters for PCM Television Video CircuitsThis standard describes methods for measuring ther performance of uniformly coded alnalog-to-digital (A/D) coverters and digital-to-anal ... withdrawn Standard
748-1979 - IEEE Standard for Spectrum AnalyzersWithdrawn Standard. This standard applies to frequenct scanning spectrum analyzers. withdrawn Standard
771-1984 - IEEE Guide to the Use of ATLASThis guide has mainly been written as an applications manual for engineers and authors who will be writing test procedures in ATLAS. The ... superseded Standard
771-1989 - IEEE Guide to the Use of the ATLAS SpecificationSuperseded. This guide has been written as an applications manual for engineers and authors who will be writing test procedures in ATLA ... withdrawn Standard
790-1989 - IEEE Guide for Medical Ultrasound Field Parameter MeasurementsWithdrawn Standard. Withdrawn Date: Jan 10, 2002. No longer endorsed by the IEEE. This standard describes procedures for measuring ultr ... withdrawn Standard
844.1/CSA C22.2 No.293.1-2017 - Standard for Skin Effect Trace Heating of Pipelines, Vessels, Equipment, and Structures - General, Testing, Marking, and Documentation RequirementsGeneral requirements, testing, markings, and documentation for skin effect trace heating systems for pipelines, vessels, equipment, and ... active Standard
1057-1989 - IEEE Trial-Use Standard for Digitizing Waveform Recorders"The purpose of this trial-use standard is to provide common terminology and test methods for describing the performance of waveform rec ... withdrawn Standard
1057-1994 - IEEE Standard for Digitizing Waveform RecordersSuperseded by IEEE Std 1057-2007. Terminology and test methods for describing the performance of waveform recorders are provided. superseded Standard
1057-2007 - IEEE Standard for Digitizing Waveform RecordersRevision of IEEE Std 1057-1994. This standard defines specifications and describes test methods for measuring the performance of electro ... superseded Standard
1057-2017 - IEEE Draft Standard for Digitizing Waveform RecordersTerminology and test methods for describing the performance of waveform recorders are presented. active Standard
1122-1987 - IEEE Standard for Digital Recorders for Measurements in High-Voltage Impulse TestsDigital recorders and digital oscilloscopes used for measurements during tests with high-impulse voltages and high-impulse currents are ... superseded Standard
1122-1998 - IEEE Standard for Digital Recorders for Measurements in High-Voltage Impulse TestsReaffirmed September 2007. Instructions are given for conducting and reporting the more generally applicable and acceptable tests to det ... active Standard
1139-1988 - IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time MetrologyMethods of describing random instabilities of importance to frequency and time metrology is covered in this standard. Quantities covered ... withdrawn Standard
1139-1999 - IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology-Random InstabilitiesMethods of describing random instabilities of importance to frequency and time metrology is covered in this standard. Quantities covered ... superseded Standard
1139-2008 - IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology--Random InstabilitiesMethods of describing random instabilities of importance to frequency and time metrology are covered in this standard. Quantities cover ... active Standard
1149.1-1990 - IEEE Standard Test Access Port and Boundary-Scan ArchitectureCircuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boar ... superseded Standard
1149.1-2001 - IEEE Standard Test Access Port and Boundary Scan ArchitectureCircuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boar ... superseded Standard
1149.1-2013 - IEEE Standard for Test Access Port and Boundary-Scan ArchitectureCircuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit board ... active Standard
1149.1a-1993 - Supplement to Standard Test Access Port and Boundary-Scan Architecture (1149.1) A test access port and boundary-scan architecture for digital integrated circuits and for the digital portions of mixed analog/digital ... superseded Standard
1149.4-2010 - IEEE Standard for a Mixed-Signal Test BusThe testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mix ... active Standard
1149.6-2015 - IEEE Standard for Boundary-Scan Testing of Advanced Digital NetworksIEEE Std 1149.1(TM) is augmented by this standard to improve the ability for testing differential and/or ac-coupled interconnections bet ... active Standard
1149.7-2009 - IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan ArchitectureThis specification describes circuitry that may be added to an integrated circuit to provide access to on-chip Test Access Ports (TAPs) ... active Standard