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Instrumentation and Measurement Standards

Instrumentation and Measurement Standards
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2-1929 - A.I.E.E. Revised Report on Standard Definitions and SymbolsThe definitions assembled in this revised Report have been taken largely from the latest approved sections of the A. I. E. E. Standards. ... active Standard
3-1982 - IEEE Recommended Practice in the Selection of Reference Ambient Conditions for Test Measurements of Electrical ApparatusIt is the purpose of this document to identify and recommended a set of standard reference values for certain ambient parameters which a ... withdrawn Standard
33-1927 - AIEE Standards - Electrical Measuring InstrumentsThe standards in this section apply to the following kinds of indicating electrical instruments for direct current and for alternating c ... withdrawn Standard
91/91a-1984 - IEEE Standard Graphic Symbols for Logic Functions (Including and incorporating IEEE Std 91a-1991, Supplement to IEEE Standard Graphic Symbols for Logic Functions)Graphic symbols for representing logic functions or physical devices capable of carrying out logic functions are presented. Descriptions ... active Standard
91a-1991 - IEEE Standard Graphic Symbols for Logic Functions (Including and incorporating IEEE Std 91a-1991, Supplement to IEEE Standard Graphic Symbols for Logic Functions)Graphic symbols for representing logic functions or physical devices capable of carrying out logic functions are presented. Descriptions ... active Standard
101A-1974 - IEEE Simplified Method for Calculation of the Regression Line (Appendix to IEEE Guide for the Statistical Analysis of Thermal Life Test Data, IEEE Std 101-1972)The purpose of this appendix is to present a method for quickly plotting the regression line for a set of life data. This method may be ... active Standard
118-1978 - IEEE Standard Test Code for Resistance MeasurementMethods of measuring electrical resistance that are commonly used to determine the characteristics of electric machinery and equipment a ... withdrawn Standard
181-1977 - IEEE Standard on Pulse Measurement and Analysis by Objective TechniquesWithdrawn Standard. This standard presents approximately 100 terms, and their definitions, for accurately and precisely describing the w ... withdrawn Standard
181-2011 - IEEE Standard for Transitions, Pulses, and Related WaveformsApproximately 100 terms and their definitions, for accurately and precisely describing the waveforms of pulse signals and the process of ... active Standard
191-1953 - IEEE Standard on Sound Recording and Reproducing Methods of Measurement of NoiseNoise is a limiting factor in any system which stores information because it limits the signal-to-noise ratio and hence the total quanti ... withdrawn Standard
194-1977 - IEEE Standard Pulse Terms and DefinitionsWithdrawn Standard. Withdrawn Date: Sep 15, 1993. No longer endorsed by the IEEE. This standard provides fundamental definitions for ge ... withdrawn Standard
200-1975 - IEEE Standard Reference Designations for Electrical and Electronics Parts and EquipmentsThe formulation and application of reference designations for electrical and electronics parts and equipment are covered. The reference ... withdrawn Standard
218-1956 - IEEE Standard Methods of Testing TransistorsThis standard deals with the methods of measurement of important characteristics of transistors. In general, these characteristics are r ... withdrawn Standard
257-1964 - IEEE Technical Committee Report on Recommended Practices for Burst Measurements in the Time DomainThe evolution of technology and the advancement of communications have resulted in an increased awareness of energy bursts. Such bursts ... active Standard
260.1-2004 - IEEE Standard Letter Symbols for Units of Measurement (SI Customary Inch-Pound Units, and Certain Other Units)Revision of IEEE Std 260.1-1993, Letter symbols for units of measurement are covered in this standard. active Standard
260.3-1993 - American National Standard Mathematical Signs and Symbols for Use in Physical Sciences and TechnologySigns and symbols used in writing mathematical text are defined. Special symbols peculiar to certain branches of mathematics, such as no ... active Standard
260.4-1996 - American National Standard Letter Symbols and Abbreviations for Quantities Used in AcousticsReaffirmed 2008. Letter symbols for physical quantities used in the science and technology of acoustics are covered. Abbreviations for a ... active Standard
265-1966 - IEEE Recommended Practices for Burst Measurements in the Frequency DomainThis document is a companion to Technical Committee Report on Recommended Practices for Burst Measurements in the Time Domain, IEEE No. ... active Standard
270-2006 - IEEE Standard Definitions for Selected Quantities, Units, and Related Terms, with Special Attention to the International System of Units (SI)The definitions for physical quantities and units commonly used in applied science and technology, and for related terms that concern sy ... active Standard
284-1968 - IEEE Standards Report on State-of-the-Art of Measuring Field Strength, Continuous Wave, SinusoidalThis document is a Report on the state-of-the-art of measuring field strength of radio-frequency electromagnetic waves, with respect to ... withdrawn Standard
285-1968 - IEEE Standards Report on State-of-the-Art of Measuring Phase Shift at Frequencies above 1 GhzA discussion of the available standard phase shifters, the general principles of measurement techniques, and the basic measurement preca ... withdrawn Standard
287-2007 - IEEE Standard for Precision Coaxial Connectors (DC to 110 GHz)This standard presents the combined efforts of IEEE Subcommittee P287 that reflect the knowledge and experience of leading specialists i ... active Standard
297-1969 - IEEE Recommended Practice for Speech Quality MeasurementsThe increasing variety of speech transmission systems has created a new problem for communication engineers. This problem consists of th ... withdrawn Standard
311-1970 - IEEE Standard Specification of General-Purpose Laboratory Cathode-Ray Oscilloscopes"The purposes of this Standard are: to document the minimum information that users of general-purpose laboratory cathode-ray oscilloscop ... withdrawn Standard
315-1975 - IEEE Standard for Graphic Symbols for Electrical and Electronics Diagrams (Including Reference Designation Letters)A list of graphic symbols and class designation letters for use on electrical and electronics diagrams is provided. All of the symbols a ... active Standard
318-1971 - IEEE Trial Use Standard Guide on Solid State Devices: Varactor Measurements Part 1- Small Signal MeasurementsThis guide describes several methods of measurement for the small signal characterization of varactors. For the purpose of this guide, a ... withdrawn Standard
416-1984 - IEEE Standard ATLAS Test LanguageThis standard defines ATLAS, the Abbreviated Test Language for All Systems, which offers a standardized test language for expressing tes ... withdrawn Standard
451-1955 - AIEE Proposed Recommended Guide for Sepecification of Signal SourcesThe purpose of these specifications is to give a common basis for comparison among signal sources used for test purposes. It is recommen ... withdrawn Standard
454-1973 - IEEE Recommended Practice for the Detection and Measurement of Partial Discharges (Corona) During Dielectric TestsThis document is based on IEC Publication 270-1968, Partial Discharge Measurements. adheres closely to the IEC recommendations with the ... active Standard
460-1988 - IEEE Standard for Electrical Measuring Transducer for Converting AC Electrical Quantities into DC Electrical QuantitiesThis standard applies to measuring transducers used for converting AC electrical quantities such as current, voltage, power (active or r ... withdrawn Standard
470-1972 - IEEE Standard Application Guide for Bolometric Power MetersWithdrawn Standard. Withdrawn Date: Dec 06, 1990. This standard applies to bolometric power meters as complete instruments and to their ... withdrawn Standard
474-1973 - IEEE Standard Specifications and Test Methods for FIxed and Variable Attenuators, DC-40 GHzThis performance standard covers absorptive and reflective attenuators, both fixed as well as continuously variable or variable in fixed ... withdrawn Standard
488.1-2003 - IEEE Standard For Higher Performance Protocol for the Standard Digital Interface for Programmable InstrumentationThis standard applies to interface systems used to interconnect both programmable and nonprogrammable electronic measuring apparatus wit ... active Standard
488.2-1992 - IEEE Standard Codes, Formats, Protocols, and Common Commands for Use With IEEE Std 488.1-1987, IEEE Standard Digital Interface for Programmable InstrumentationA set of codes and formats to be used by devices connected via the IEEE 488.1 bus is specified. This standard also defines communication ... active Standard
515-2017 - IEEE Standard for the Testing, Design, Installation, and Maintenance of Electrical Resistance Trace Heating for Industrial ApplicationsSpecific testing requirements for qualifying electrical resistance trace heating for use in industrial applications in ordinary location ... active Standard
544-1975 - IEEE Standard for Electrothermic Power MetersWithdrawn Standard. Withdrawn Date: Dec 06, 1990. This standard applies to electrothermic power meters as complete instruments and to th ... withdrawn Standard
586-1980 - IEEE Standard Definitions of Laser-Maser Termsno abstract. Withdrawn Standard. Withdrawn Date: Dec 06, 1990. withdrawn Standard
660-1986 - IEEE Standard for Semiconductor Memory Test Pattern LanguageThe purpose of this standard is to establish a common language for describing functional tests of memory devices. That language definiti ... withdrawn Standard
662-1992 - IEEE Standard Terminology for Semiconductor MemoryGuidelines under which data sheets for new semiconductor memories are to be generated are provided. Adherence to these guidelines is int ... withdrawn Standard
716-1995 - IEEE Standard Test Language for All Systems - Common/Abbreviated Test Language for All Systems (C/ATLAS)A high order language for testing is defined. This language is designed to describe tests in terms that are independent of any specific ... active Standard
746-1984 - IEEE Standard for Performance Measurements of A/D and D/A Converters for PCM Television Video CircuitsThis standard describes methods for measuring ther performance of uniformly coded alnalog-to-digital (A/D) coverters and digital-to-anal ... withdrawn Standard
748-1979 - IEEE Standard for Spectrum AnalyzersWithdrawn Standard. This standard applies to frequenct scanning spectrum analyzers. withdrawn Standard
771-1989 - IEEE Guide to the Use of the ATLAS SpecificationSuperseded. This guide has been written as an applications manual for engineers and authors who will be writing test procedures in ATLA ... withdrawn Standard
790-1989 - IEEE Guide for Medical Ultrasound Field Parameter MeasurementsWithdrawn Standard. Withdrawn Date: Jan 10, 2002. No longer endorsed by the IEEE. This standard describes procedures for measuring ultr ... withdrawn Standard
844.1/CSA C22.2 No.293.1-2017 - Standard for Skin Effect Trace Heating of Pipelines, Vessels, Equipment, and Structures - General, Testing, Marking, and Documentation RequirementsGeneral requirements, testing, markings, and documentation for skin effect trace heating systems for pipelines, vessels, equipment, and ... active Standard
1057-1989 - IEEE Trial-Use Standard for Digitizing Waveform Recorders"The purpose of this trial-use standard is to provide common terminology and test methods for describing the performance of waveform rec ... withdrawn Standard
1057-2017 - IEEE Draft Standard for Digitizing Waveform RecordersTerminology and test methods for describing the performance of waveform recorders are presented. active Standard
1122-1998 - IEEE Standard for Digital Recorders for Measurements in High-Voltage Impulse TestsReaffirmed September 2007. Instructions are given for conducting and reporting the more generally applicable and acceptable tests to det ... active Standard
1139-1988 - IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time MetrologyMethods of describing random instabilities of importance to frequency and time metrology is covered in this standard. Quantities covered ... withdrawn Standard
1139-2008 - IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology--Random InstabilitiesMethods of describing random instabilities of importance to frequency and time metrology are covered in this standard. Quantities cover ... active Standard
1149.1-2013 - IEEE Standard for Test Access Port and Boundary-Scan ArchitectureCircuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit board ... active Standard
1149.4-2010 - IEEE Standard for a Mixed-Signal Test BusThe testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mix ... active Standard
1149.6-2015 - IEEE Standard for Boundary-Scan Testing of Advanced Digital NetworksIEEE Std 1149.1(TM) is augmented by this standard to improve the ability for testing differential and/or ac-coupled interconnections bet ... active Standard
1149.7-2009 - IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan ArchitectureThis specification describes circuitry that may be added to an integrated circuit to provide access to on-chip Test Access Ports (TAPs) ... active Standard
1149.8.1-2012 - IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active ComponentsExtensions to IEEE Std 1149.1(TM) that define the boundary-scan structures and methods required to facilitate boundary-scan-based stimul ... active Standard
1149.10-2017 - IEEE Standard for High-Speed Test Access Port and On-Chip Distribution ArchitectureCircuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boar ... active Standard
1174-2000 - IEEE Standard Serial Interface for Programmable InstrumentationThis project defines a serial, full-duplex, asynchronous, 9-pin DTE communications port that follows EIA 574 and related standards. Port ... active Standard
1193-2003 - IEEE Guide for Measurement of Environmental Sensitivities of Standard Frequency GeneratorsStandard frequency generators that include all atomic frequency standards and precision quartz crystal oscillators are addressed. active Standard
1226-1998 - IEEE Standard for a Broad-Based Environment for Test (ABBET™), Overview and ArchitectureWithdrawn Standard. Withdrawn Date: Jan 16, 2004. The overall concept of A Broad-Based Environment for Test (ABBET) TM is defined, andm ... withdrawn Standard
1232-2010 - IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)Data interchange and standard software services for test and diagnostic environments are defined by Artificial Intelligence Exchange and ... active Standard
1232.3-2014 - IEEE Guide for the Use of Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)Guidance to developers of IEEE Std 1232-conformant applications is provided in this guide. A simple doorbell is used as an example syste ... active Standard
1241-2010 - IEEE Standard for Terminology and Test Methods for Analog-to-Digital ConvertersThe material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of ana ... active Standard
1332-2012 - IEEE Standard Reliability Program for the Development and Production of Electronic ProductsA standard set of reliability program objectives for use between customers and producers, or within product development teams, to expres ... active Standard
1377-1997 - IEEE Standard for Utility Industry End Device Data TablesFunctionally related utility application data elements, grouped into a single data structurefor transport are described. Data may be uti ... withdrawn Standard
1377-2012 - IEEE Standard for Utility Industry Metering Communication Protocol Application Layer (End Device Data Tables)Common structures are provided in this standard for encoding data in communication between End Devices (meters, home appliances, IEEE 17 ... active Standard
1413-2010 - IEEE Standard Framework for Reliability Prediction of HardwareThe framework for the reliability prediction for electronic hardware is covered in this standard. This standard identifies required elem ... active Standard
1413.1-2002 - IEEE Guide for Selecting and Using Reliability Predictions Based on IEEE 1413 framework for reliability prediction procedures for electronic equipment at all levels is provided in this guide . active Standard
1445-2016 - IEEE Standard for Digital Test Interchange Format (DTIF)The information content and the data formats for the interchange of digital test program data between digital automated test program gen ... active Standard
1450.1-2005 - IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design EnvironmentsReplaced by IEC 62526 Ed. 1 (2007-11).Standard Test Interface Language (STIL) provides an interface between digital test generation tool ... active Standard
1450.3-2007 - IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target SpecificationThe STIL environment supports transferring tester-independent test programs to a specific ATE system. Although native STIL data are test ... active Standard
1450.4-2017 - IEEE Approved Draft Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Test Flow SpecificationThis standard extends IEEE Std 1450-1999 (STIL) to 39 provide an interface between test generation tools and test equipment with regard ... active Standard
1450.6-2006 - IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)The Core Test Language (CTL) is a language created for a System-on-Chip flow (or SoC flow), where a design created by one group is reuse ... active Standard
1450.6.1-2009 - IEEE Standard for Describing On-Chip Scan CompressionThis standard defines how the necessary information is passed from scan insertion to pattern generation and from pattern generation to d ... active Standard
1450.6.2-2014 - IEEE Standard for Memory Modeling in Core Test LanguageReuse of test data and test structures developed for individual cores (designs) when integrated into larger integrated circuits is requi ... active Standard
1451.0-2007 - IEEE Standard for a Smart Transducer Interface for Sensors and Actuators - Common Functions, Communication Protocols, and Transducer Electronic Data Sheet (TEDS) FormatsIt defines the functions that are to be performed by a transducer interface module (TIM) and the common characteristics for all devices ... active Standard
1451.1-1999 - IEEE Standard for a Smart Transducer Interface for Sensors and Actuators - Network Capable Application Processor Information ModelThis standard defines an object model with a network-neutral interface for connecting processors to communication networks, sensors, and ... active Standard
1451.2-1997 - IEEE Standard for a Smart Transducer Interface for Sensors and Actuators - Transducer to Microprocessor Communication Protocols and Transducer Electronic Data Sheet (TEDS) FormatsA digital interface for connecting transducers to microprocessors is deÞned. A TEDS and its data formats are described. An electrical i ... active Standard
1451.3-2003 - IEEE Standard for a Smart Transducer Interface for Sensors and Actuators - Digital Communication and Transducer Electronic Data Sheet (TEDS) Formats for Distributed Multidrop SystemsA digital interface for connecting multiple physically separated transducers to a single processor over a single pair of wires. The inte ... withdrawn Standard
1451.4-2004 - IEEE Standard for A Smart Transducer Interface for Sensors and Actuators--Mixed-Mode Communication Protocols and Transducer Electronic Data Sheet (TEDS) FormatsThis standard defines the protocol and interface that allows analog transducers to communicate digital information with an IEEE 1451 obj ... active Standard
1451.5-2007 - IEEE Standard for a Smart Transducer Interface for Sensors and Actuator -- Wireless Communication Protocols and Transducer Electronic Data Sheet (TEDS) FormatsThis standard defines a wireless interface for sensors. It specifies radio-specific protocols for this wireless interface. It defines co ... active Standard
1460-1996 - IEEE Guide for the Measurement of Quasi-Static Magnetic and Electric FieldsA listing of possible measurement goals related to characterizing quasi-static magnetic and electric fields and possible methods for the ... active Standard
1500-2005 - IEEE Standard Testability Method for Embedded Core-based Integrated CircuitsThis standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware arch ... active Standard
1505-2010 - IEEE Standard for Receiver Fixture InterfaceA mechanical and electrical specification for implementing a common interoperable mechanical quick-disconnect interconnect system for us ... active Standard
1505.1-2008 - IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is p ... active Standard
1505.3-2015 - IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505™ Receiver Fixture Interface StandardPortable/benchtop test equipment applications are supported in this document by defining a mass interconnection scheme and pin configura ... active Standard
1522-2004 - IEEE Standard for Testability and Diagnosability Characteristics and MetricsThis standard was developed to provide standard, unambiguous definitions of testability diagnosability metrics and characteristics. It b ... withdrawn Standard
1541-2002 - IEEE Standard for Prefixes for Binary MultiplesReaffirmed 2008. Names and letter symbols for prefixes that denote multiplication of a unit by the binary multiplier 2 10 n ,where n =1, ... active Standard
1545-1999 - IEEE Standard for Parametric Data Log FormatJan 2005: Administratively withdrawn. A language and file format for describing parametric test data is defined. Data types, dataforma ... withdrawn Standard
1588-2008 - IEEE Standard for a Precision Clock Synchronization Protocol for Networked Measurement and Control SystemsThis standard defines a protocol enabling precise synchronization of clocks in measurement and control systems implemented with technolo ... active Standard
1624-2008 - IEEE Standard for Organizational Reliability CapabilityOrganizational reliability capability and the identification of the criteria for assessing the reliability capability of an organization ... active Standard
1636-2009 - IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA)This document provides an implementation-independent specification for a software interface to information systems containing data perti ... active Standard
1636.2-2010 - IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Maintenance Action Information via the Extensible Markup Language (XML)Interoperability between components of automatic test systems (ATS) is promoted and facilitated. The standard facilitates the capture of ... active Standard
1641-2010 - IEEE Standard for Signal and Test DefinitionThis standard provides the means to define and describe signals used in testing. It also provides a set of common basic signals, built u ... active Standard
1641.1-2013 - IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test DefinitionGuidance in the use of the signal and test definition (STD) standard, IEEE Std 1641-2010, is provided. IEEE Std 1641 provides the means ... active Standard
1658-2011 - IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter DevicesTerminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs ... active Standard
1671-2010 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XMLThis document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system ... active Standard
1671.1-2017 - IEEE Approved Draft Standard for Automatic Test Markup Language (ATML) Test DescriptionThis standard defines an exchange format, utilizing Extensible Markup Language (XML), for both the static description of unit under test ... active Standard
1671.2-2012 - IEEE Standard for Automatic Test Markup Language (ATML) Instrument DescriptionAn exchange format is specified in this standard, using extensible markup language (XML), for identifying instrumentation that may be in ... active Standard
1671.3-2017 - IEEE Approved Draft Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) DescriptionNo purpose statement is required since this standard is intended for IEC standardization. active Standard
1671.4-2014 - IEEE Standard for Automatic Test Markup Language (ATML) Test ConfigurationAn exchange format is specified in this standard, using extensible markup language (XML), for identifying the test configuration used to ... active Standard
1671.5-2015 - IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter DescriptionAn exchange format using extensible markup language (XML) for identifying all of the hardware, software, and documentation associated wi ... active Standard
1671.6-2015 - IEEE Standard for Automatic Test Markup Language (ATML) Test Station DescriptionAn exchange format, using extensible markup language (XML), for identifying all of the hardware, software, and documentation associated ... active Standard
1687-2014 - IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor DeviceA methodology for accessing instrumentation embedded within a semiconductor device, without defining the instruments or their features t ... active Standard
1696-2013 - IEEE Standard for Terminology and Test Methods for Circuit ProbesCurrently, no defined, industry-accepted method exists for characterizing the performance of electrical circuit probes. Each vendor has ... active Standard
1783-2009 - IEEE Guide for Test Methods and Procedures to Evaluate the Electrical Performance of Insulators in Freezing ConditionsThe guide specifies procedures for testing equipment when external insulation of the test object is subjected to combinations of contami ... active Standard
1804-2017 - IEEE Approved Draft Standard for Fault Accounting and Coverage Reporting to Digital Modules (FACR)The standard formalizes aspects of fault models as they are relevant to the generation of test patterns for digital circuits. Its scope ... active Standard
1851-2012 - IEEE Standard for Design Criteria of Integrated Sensor-Based Test Applications for Household AppliancesAn integrated framework of the test software for household appliances is defined. This standard specifies the test environment and the t ... active Standard
1856-2017 - IEEE Standard Framework for Prognostics and Health Management of Electronic SystemsInformation for the implementation of prognostics and health management (PHM) for electronic systems is described in this standard. A no ... active Standard
1858-2016 - IEEE Standard for Camera Phone Image QualityQuantifying the performance of camera-equipped mobile devices is covered in this standard, with an emphasis on metrics and procedures ap ... active Standard
1871.2-2017 - IEEE Draft Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adaptors and Test EquipmentThis document is a recommended practice to extending the ATML exchange formats to for the purposes describing intrinsic paths. The recom ... active Standard
2400-2016 - IEEE Standard for Wind Turbine Aero Acoustic Noise Measurement TechniquesTechniques to select wind turbine and wind farm aero acoustic noise measurements, including instrumentation standards and metrology tech ... active Standard
2402-2017 - IEEE Standard Design Criteria of Complex Virtual Instruments for Ocean ObservationThe framework of building a distributed ocean observing software system based on complex virtual instruments (CVIs), which are used for ... active Standard
21450-2010 - Information technology -- Smart transducer interface for sensors and actuators -- Common functions, communication protocols, and Transducer Electronic Data Sheet (TEDS) formatsAdoption of IEEE Std 1451.0-2007. This standard provides a common basis for members of the IEEE 1451 family of standards to be interoper ... active Standard
21451-1-2010 - ISO/IEC/IEEE Standard for Information technology -- Smart transducer interface for sensors and actuators -- Part 1: Network Capable Application Processor (NCAP) information modelAdoption of IEEE Std 1451.1-1999. This standard defines an object model with a network-neutral interface for connecting processors to co ... active Standard
60488-1-2004 - IEC/IEEE 60488-1 Ed.1 (IEEE Std 488.1™-2003): Higher Performance Protocol for the Standard Digital Interface for Programmable Instrumentation - Part 1: GeneralSuperedes IEEE Std 488.1-2003 This standard applies to interface systems used to interconnect both programmable and nonprogrammable ele ... active Standard
60488-2-2004 - IEC 60488-2 Ed.1 (IEEE Std 488.2™-1992): Standard Digital Interface for Programmable Instrumentation - Part 2: Codes, formats, protocols and common commandsA set of codes and formats to be used by devices connected via the IEEE 488.1 bus is specified. This standard also defines communicatio ... active Standard
61588-2009 - IEC 61588 Ed.2 (IEEE Std 1588-2008): Precision Clock Synchronization Protocol for Networked Measurement and Control SystemsA protocol is provided in this standard that enables precise synchronization of clocks in measurement and control systems implemented wi ... active Standard
61671-2012 - IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XMLThis document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system ... active Standard
61671-5-2016 - IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter DescriptionAn exchange format using extensible markup language (XML) for identifying all of the hardware, software, and documentation associated wi ... active Standard
61671-6-2016 - IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Station DescriptionAn exchange format, using extensible markup language (XML), for identifying all of the hardware, software, and documentation associated ... active Standard
62243-2010 - IEC 62243:2012(E) (IEEE Std 1232-2010): Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)Data interchange and standard software services for test and diagnostic environments are defined by Artificial Intelligence Exchange and ... active Standard
62525-2007 - (IEEE Std 1450-1999) International Standard Test Interface Language (STIL) for Digital Test Vector DataStandard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test descripti ... active Standard
62526-2007 - IEC 62526 Ed. 1 (IEEE Std 1450.1™-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design EnvironmentsStandard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to th ... active Standard
62527-2007 - IEC 62527 Ed. 1 (IEEE Std 1450.2™-2002): Standard for Extensions to Standard Test Interface Language (STIL) for DC Level SpecificationThis standard extends IEEE Std 1450-1999 (STIL) to support the definition of DC levels. STIL language constructs are defined to specify ... active Standard
62529-2012 - IEC 62529:2012(E) Standard for Signal and Test DefinitionAdoption of IEEE Std 1641-2010. This standard provides the means to define and describe signals used in testing. It also provides a set ... active Standard
63003-2015 - IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is p ... active Standard
63004-2015 - IEC/IEEE International standard for receiver fixture interfaceA mechanical and electrical specification for implementing a common interoperable mechanical quick-disconnect interconnect system for us ... active Standard
C12.1-1988 - American National Standard Code for Electricity MeteringAcceptable performance criteria for new types of AC watthour meters, demand meters, demand registers, pulse devices, instrument transfor ... withdrawn Standard
C12.4-1984 - American National Standard for Mechanical Demand RegistersThe voltage and frequency rating, full-scale values, scale classes, demand intervals, multiplying constants, timing mechanism, and other ... withdrawn Standard
C12.6-1987 - American National Standard for Marking and Arrangement of Terminals for Phase-Shifting Devices Used in MeteringPhase-shifting devices designed to provide the proper lagged voltages required for kVAR and kVA measurement are covered. Terminal markin ... withdrawn Standard
C12.7-1993 - American National Standard Requirements for Watthour Meter SocketsThe general requirements and pertinent dimensions applicable to watthour meter sockets rated up to and including 600 V, and up to and in ... withdrawn Standard
C12.8-1981 - American National Standard for Test Blocks and Cabinets for Installation of Self-Contained A-Base Watthour MetersThe dimensions and functions of test blocks and cabinets used with self-contained A-base watthour meters are covered. Standard ratings a ... withdrawn Standard
C12.9-1993 - American National Standard for Test Switches for Transformer-Rated MetersThe dimensions and functions of meter test switches used with transformer-rated watthour meters in conjunction with instrument transfor ... withdrawn Standard
C12.10-1987 - American National Standard for Electromechanical Watthour MetersClass designations, voltage and frequency ratings, test-current values, internal wiring arrangements, pertinent dimensions, rotor markin ... withdrawn Standard
C12.11-1987 - American National Standard for Instrument Transformers for Revenue Metering, 10 kV BIL Through 350 kV BIL (0.6 kV NSV through 69 kV NSV)The general requirements, metering accuracy, thermal ratings, and dimensions are established for current and inductively coupled voltage ... withdrawn Standard
C12.13-1991 - American National Standard for Electronic Time-of-Use Registers for Electricity MetersElectronic time-of-use registers for use in conjunction with electricity meters are covered. The following features are included: number ... withdrawn Standard
C12.14-1982 - American National Standard for Magnetic Tape Pulse Recorders for Electricity MetersMinimum requirements for magnetic tape pulse recorders for electricity meters are recommended. The voltage, frequency ratings, recording ... withdrawn Standard
C12.15-1990 - American National Standard for Solid-State Demand Registers for Electromechanical Watthour Meters This standard covers solid-state demand registers for use with electromechanical watthour meters. It includes Number and format of dis ... withdrawn Standard
C12.17-1991 - American National Standard for Cartridge-Type Solid-State Pulse Recorders for Electricity MeteringMinimum requirements for cartridge-type solid-state pulse recorders for electricity metering are recommended. Voltage and frequency rati ... withdrawn Standard
N323AB-2013 - American National Standard for Radiation Protection Instrumentation Test and Calibration, Portable Survey InstrumentsTesting, calibration, and calibration frequency requirements for portable radiation detectors used to directly measure alpha, beta, phot ... active Standard
SI 10-2016 - American National Standard for Metric PracticeGuidance for the use of the modern metric system is given. Known as the International System of Units (abbreviated SI), the system is th ... active Standard