Standard icon

IEEE STANDARD

759-1984 - IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers

Description: Administratively Withdrawn January 2007. Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented. Energy resolution, spectral distortion, pulse-height linearity, counting rate effects, overload effects, pulse-height stability, and efficiency are covered. Test procedures for pulse-height analyzers and computers are not covered.
  • Status: Withdrawn Standard Help

Get This Standard

Buy Purchase a copy of this standard Buy External Link
Buy VuSpec CD ROM This standard can be purchased as part of the following VuSpect CD:
- IEEE Nuclear Power Engineering Collection (Includes Historical Standards) Buy
Access with Subscription External Link Standards Online subscribers can access this standard in IEEE Xplore Digital Library. Access Learn More