Standard icon

IEEE STANDARD

759-1984 - IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers

Description: Administratively Withdrawn January 2007. Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented. Energy resolution, spectral distortion, pulse-height linearity, counting rate effects, overload effects, pulse-height stability, and efficiency are covered. Test procedures for pulse-height analyzers and computers are not covered.
  • Status: Withdrawn Standard Help
Oversight Committee: NPS/NI&D - Nuclear Instruments and Detectors

Get This Standard

Buy Purchase a copy of this standard Buy External Link
Buy VuSpec CD ROM This standard can be purchased as part of the following VuSpect CD:
- IEEE Nuclear Power Engineering Collection: VuSpec (Including Historical Standards) Buy
Access with Subscription External Link Standards Online subscribers can access this standard in IEEE Xplore Digital Library. Access Learn More

Related Standards

Nuclear Power Standards
Instrumentation and Measurement Standards

Additional Resources

Join IEEE-SA & Save!

IEEE-SA Individual Members save 10% (on average)* on most standards purchased through IEEE.
* actual savings vary per standard