Standard icon

IEEE STANDARD

300-1988 - IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors

Description: This standard applies to semiconductor radiation detectors that are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described were selected to be readily available to all manufacturers and users of charged-particle detectors. The object of this standard is to establish standard test procedures for semiconductor charged-particle detectors. These detectors are in widespread use for the detection and high-resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users.
  • Status: Active Standard Help
Oversight Committee: NPS/NI&D - Nuclear Instruments and Detectors

Get This Standard

Buy Purchase a copy of this standard Buy External Link
Buy VuSpec CD ROM This standard can be purchased as part of the following VuSpect CD:
- IEEE Nuclear Power Engineering Collection: VuSpec (Including Historical Standards) Buy
Access with Subscription External Link Standards Online subscribers can access this standard in IEEE Xplore Digital Library. Access Learn More

Related Standards

Nuclear Power Standards
Instrumentation and Measurement Standards

Additional Resources

Join IEEE-SA & Save!

IEEE-SA Individual Members save 10% (on average)* on most standards purchased through IEEE.
* actual savings vary per standard