Standard icon


IEEE 256-1963 - IEEE Test Procedure for Semiconductor Diodes

Description: This Standard recommends and describes methods of measurement of the important electrical characteristics of semiconductor diodes. For the purpose of this Standard, a semiconductor diode is defined1 as: A semiconductor device having two terminals and exhibiting a nonlinear voltage--current characteristic; in more restricted usage, a semiconductor device which has the asymmetrical voltage--current characteristic exemplified by a single p-n junction. Methods of test are described for static, small-signal and pulse parameters. Many of the terms considered herein have been set down in AI E E and IRE Standards, particularly in 60 IRE 28.SH and AI EE No. 4252.
  • Status:Inactive-Withdrawn STDHelp

Get This Standard

Buy Purchase a copy of this standardBuyExternal Link
Access with Subscription External Link Standards Online subscribers can access this standard in IEEE Xplore Digital Library. Access Learn More