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IEEE Std 1445-2016 (Revision of IEEE Std 1445-1998) - IEEE Standard for Digital Test Interchange Format (DTIF)

Description: The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This information can be broadly grouped into data that defines the following: user under test (UUT) model, stimulus and response, fault dictionary, and probe.
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