Superseded Standard

IEEE 1445-1998

IEEE Standard for Digital Test Interchange Format (DTIF)

The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are deÞned. This information can be broadly grouped into data that deÞnes the following: UUT Model, Stimulus and Response, Fault Dictionary, and Probe.

Sponsor Committee
BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Learn More About BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Status
Superseded Standard
Superseded by
1445-2016
Board Approval
1998-12-08
History
ANSI Approved:
1999-11-16
Published:
1999-03-10
Reaffirmed:
2009-12-09

Working Group Details

Society
IEEE SA Board of Governors
Sponsor Committee
BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Learn More About BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Working Group
DMC_WG - Diagnostic and Maintenance Control Working Group
IEEE Program Manager
Christian Orlando
Contact Christian Orlando
Working Group Chair
John Sheppard

Other Activities From This Working Group

Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.


No Active Projects

Standards approved by the IEEE SA Standards Board that are within the 10-year lifecycle.


1232.3-2014

IEEE Guide for the Use of Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)

Guidance to developers of IEEE Std 1232-conformant applications is provided in this guide. A simple doorbell is used as an example system under test to illustrate how the static model constructs of Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) are used to form a diagnostic reasoner knowledge base. Each of AI-ESTATE's knowledge base types is discussed in conceptual terms, and how those concepts are represented in exchange files is shown. Also, some of the nuanced aspects of diagnostic knowledge bases in AI-ESTATE are clarified. An example reasoner session is provided to illustrate the use of AI-ESTATE services.

Learn More About 1232.3-2014

1445-2016

IEEE Standard for Digital Test Interchange Format (DTIF)

The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This information can be broadly grouped into data that defines the following: user under test (UUT) model, stimulus and response, fault dictionary, and probe.

Learn More About 1445-2016

1636-2018

IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA)

Promoting and facilitating interoperability between components of automatic test systems where test results and/or maintenance actions need to be shared is addressed in this standard. The standard defines the common elements between both test results data and maintenance action data. The common schema becomes a class of information that shall be used within the SIMICA family of standards.

Learn More About 1636-2018

1636.2-2018

IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Maintenance Action Information via the Extensible Markup Language (XML)

Promoting and facilitating interoperability components of automatic test systems where actions taken during maintenance need to be shared is addressed in this standard. The standard thus facilitates the capture of maintenance action information data in storage devices and databases, facilitating online and offline analysis. The maintenance action information schema becomes a class of information that can be used within the SIMICA family of standards. The exchange format is expressed in both the OWL and XML formats.

Learn More About 1636.2-2018

1636.99-2013

IEEE Std 1636.99-2013, IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Common Information Elements.

This standard is intended to promote and facilitate interoperability between components of SIMICA. The standard defines EXPRESS information models and XML schemas that together define the common information elements supporting these interfaces.

Learn More About 1636.99-2013

These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.


1232-2002

IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI- ESTATE)

Superseded by IEC/IEEE 62243-2005. AI-ESTATE is a set of specifications for data interchange and for standard services for the test and diagnostic environment. The purpose of AI-ESTATE is to standardize interfaces between functional elements of an intelligent diagnostic reasoner and representations of diagnostic knowledge and data for use by such diagnostic reasoners. Formal information models are defined to form the basis for a format to facilitate exchange of persistent diagnostic information between two reasoners, and also to provide a formal typing system for diagnostic services. This standard then defines the services to manipulate diagnostic information and to control a diagnostic reasoner.

Learn More About 1232-2002

1636-2009

IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA)

This document provides an implementation-independent specification for a software interface to information systems containing data pertinent to the diagnosis and maintenance of complex systems consisting of hardware, software, or any combination thereof. These interfaces will support service definitions for creating application programming interfaces (API) for the access, exchange, and analysis of historical diagnostic and maintenance information. This will address the pervasive need of organizations to assess the effectiveness of diagnostics for complex systems throughout the product life cycle. The use of formal information models will facilitate exchanging historical maintenance information between information systems and analysis tools. The models will facilitate creating open system software architectures for maturing system diagnostics.

Learn More About 1636-2009

1636.1-2007

IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language(XML)

This standard is intended to promote and facilitate interoperability between components of an automatic test system (e.g., between test executive and diagnostic reasoner)where test results need to be shared. The standard thus facilitates the capture of test results data in storage devices and databases, facilitating online and offline analysis. The test results schema becomes a class of information that can be used within the SIMICA family of standards.

Learn More About 1636.1-2007

1636.1-2013

IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)

This standard is intended to promote and facilitate interoperability between components of automatic test systems where test results need to be shared. The standard thus facilitates the capture of test results data in storage devices and databases, facilitating online and offline analysis. The test results schema becomes a class of information that can be used within the SIMICA family of standards. The exchange format utilizes the XML formats.

Learn More About 1636.1-2013

1636.2-2010

IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Maintenance Action Information via the Extensible Markup Language (XML)

Interoperability between components of automatic test systems (ATS) is promoted and facilitated. The standard facilitates the capture of maintenance action information (MAI) associated with the removal, repair, and replacement of a particular system component (e.g., unit(s) under test) in order to maintain/support that particular operational system. The MAI schema becomes a class of information that can be used within the SIMICA family of standards. The exchange format utilizes the XML formats.

Learn More About 1636.2-2010

These standards have been removed from active status through a ballot where the standard is made inactive as a consensus decision of a balloting group.


1522-2004

IEEE Standard for Testability and Diagnosability Characteristics and Metrics

This standard was developed to provide standard, unambiguous definitions of testability diagnosability metrics and characteristics. It builds on fundamental definitions derived from elements in formal information models related to test and diagnosis defined in IEEE Std 1232-2002.

Learn More About 1522-2004

These standards are removed from active status through an administrative process for standards that have not undergone a revision process within 10 years.


1232-2010

IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)

Data interchange and standard software services for test and diagnostic environments are defined by Artificial Intelligence Exchange and Service Tie to All Test Environments (AIESTATE). The purpose of AI-ESTATE is to standardize interfaces for functional elements of an intelligent diagnostic reasoner and representations of diagnostic knowledge and data for use by such diagnostic reasoners. Formal information models are defined to form the basis for a format to facilitate exchange of persistent diagnostic information between two reasoners and also to provide a formal typing system for diagnostic services. The services to control a diagnostic reasoned are defined by this standard.

Learn More About 1232-2010

1546-2000

IEEE Guide for Digital Test Interchange Format (DTIF) Application

An aid in the understanding and use of digital test interchange format (DTIF) files is provided in this guide. This information will be an aid to users in developing tools such as pre-processors and postprocessors of DTIF data and other utilities.

Learn More About 1546-2000

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