Inactive-Withdrawn Standard

IEEE 1226-1998

IEEE Standard for a Broad-Based Environment for Test (ABBET(TM)), Overview and Architecture

Withdrawn Standard. Withdrawn Date: Jan 16, 2004. The overall concept of A Broad-Based Environment for Test (ABBET) TM is defined, andmandatory requirements for implementation of ABBET are specified. The elements of ABBET and their interrelationships are described. Guidelines and requirements governing the elements of theABBET set of standards and guides are established, and common terms to be used throughout theset are defined.

Sponsor Committee
BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Learn More About BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Status
Inactive-Withdrawn Standard
Board Approval
1998-12-08
History
Withdrawn:
2004-01-16
Published:
1999-06-24

Working Group Details

Society
IEEE SA Board of Governors
Sponsor Committee
BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Learn More About BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems

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