Mobile Device Image Quality Workshop China event

Mobile Device Image Quality Workshop

Friday, 7 July 2017 | 10:00AM-4:00PM China Standard Time (CST) 8/F Building B CTTL-No. 52 Haidan District, Beijing, China

About the Workshop

IEEE Conformity Assessment Program and Camera Phone Image Quality (CPIQ) Conformity Assessment Steering Committee (CASC)  invite you to attend an open discussion on the importance of mobile device image quality and how it can impact a service provider's quality of service and bottom line.

Join us to learn about the results from round robin testing and a subjective study that was conducted at multiple laboratories. Speakers include imaging experts, international carriers, testing laboratories and mobile device and chipset manufacturers who have developed an international standard that can be utilized to measure image quality.

Who should attend: 

  • Telecommunications Carriers
  • Mobile Devices and Component Manufacturers
  • OS vendors


  • Margaret Belska, Senior Manager, Imaging Program Management, Nvidia
  • Henry Koren, Director of Image Quality Engineering, Imatest
  • Zhai Mengran, Researcher of Optical Engineering, CAICT
  • Wang Shiwei, Researcher of Optical Engineering, CAICT
  • Ravi Subramaniam, Technical Director, Conformity Assessment, IEEE
  • Ben Tseng, Director of Device Analytics, Apkudo

Event Location Information

DATE: 7 July 2017

TIME:  10:00AM-4:00PM China Standard Time (CST)

NETWORKING LUNCHEON: Lunch will be served.

LOCATION: 8/F Building B CTTL - No. 52, Hua Yuan Bei Road, Haidan District, Beijing, China

中国信息通信研究院 China Academy of Information and Communication Technology (CAICT)
中国泰尔实验室 China Telecommunication Technology Labs

泰尔终端实验室 CTTL-Terminals
有线终端部 Line Communication Terminal

北京市海淀区花园北路52号B座8层 邮编:100191
8/F Building B, China Academy of ICT No.52 Huayuan N. Road, Beijing 100191, China

Special Offer

Attendees are eligible to receive 30% discount off the purchase price of IEEE 1858™, Standard for Camera Phone Image Quality (CPIQ).