<?xml version="1.0" encoding="UTF-8"?>
<tai:TestAdapterInstance xmlns:tai="urn:P-IEEE-1671.5:2008.03:TestAdapterInstance" xmlns:c="urn:IEEE-1671:2008.01:Common" xmlns:hc="urn:IEEE-1671:2008.01:HardwareCommon" xmlns:te="urn:P-IEEE-1671:2008.03:TestEquipment" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="urn:P-IEEE-1671.5:2008.03:TestAdapterInstance
TestAdapterInstance.xsd" uuid="AAAAAAAAAAAAAAAAAAAAAAAAAAAAAAAA" securityClassification="Unclassified">
	<c:DescriptionDocumentReference uuid="AAAAabcd111122223333444455556666"/>
	<c:SerialNumber>003</c:SerialNumber>
	<c:ManufactureDate>2006-09-16T00:43:12-15:00</c:ManufactureDate>
	<c:Calibration time="2007-11-16T06:13:17-00:00"/>
	<c:PowerOn count="25" time="P0Y0M0DT40H22M55S" />
	<te:SelfTestRuns>
		<te:SelfTestRun date="2008-01-11T10:07:33.0" name="Interface Test Adapter Self Test"/>
	</te:SelfTestRuns>
</tai:TestAdapterInstance>