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C62.59 - Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes

This standard sets terms, test methods, test circuits, measurement procedures and preferred result values for diodes with one or more silicon PN-junctions used for surge voltage clamping in low-voltage systems. The technology types covered are: * forward biased diodes * Zener breakdown diodes * avalanche breakdown diodes * punch-through diodes * fold-back diodes This standard does not cover thyristor surge protective components, see (b-IEEE Std C62.37)
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