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1687.2 - Standard for Describing Analog Test Access and Control

The primary purpose of this standard is to facilitate more-systematic test development for analog/mixed-signal functions within ICs by enabling portable and retargetable tests (in the same manner as IEEE1687 does for testing digital circuits), which should eventually facilitate automated generation of these tests. The second purpose of this standard is to facilitate more-systematic insertion of analog test access circuitry during the IC's design to improve testability, which should eventually facilitate automated insertion of this access. Testability might be improved by, for instance, enabling tests which detect more defects, run in less time, or use a lower-cost tester. This standard focuses on describing, in a machine-readable way, analog test access. Rather than prescribing specific hardware for test access, this standard enables the description of a range of analog test access techniques, including those already used widely in the industry. This standard describes circuitry and tests using existing languages and design-for-test (DfT) standards, wherever possible, to minimize the amount of new automation needed. When that is not possible, this standard extends the existing languages or test access standards to accommodate analog/mixed-signal functions. Specifically, this standard uses the Instrument Connectivity Language (ICL) and Procedural Description Language (PDL) defined in the IEEE 1687 Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device.
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