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P1149.10 - High Speed Test Access Port and On-chip Distribution Architecture

This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload and a distribution architecture for converting the test data to/from on-chip test structures. The standard re-uses existing High Speed I/O (HSIO) known in the industry for the High-Speed Test Access Port. The HSIO connects to an on-chip distribution architecture through a common interface. The scope includes the distribution architecture test logic and packet decoder logic. The objective of the distribution architecture and packet decoder is that it can be readily re-used with different Integrated Circuits (ICs) that host different HSIO technology such that the standard addresses as large a part of the industry as possible. The scope includes IEEE 1149.1 Boundary Scan Description Language (BSDL) and Procedural Description Language (PDL) documentation which can be used for configuring a mission mode HSIO to a test mode compatible with the High Speed Test Access Port (HSTAP). The same BSDL and PDL can then be used to deliver high-speed data to the on-chip test structures.
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