IEEE to Revise Standard for Measuring Properties of Carbon Nanotubes
Contact:
Karen McCabe, IEEE-SA
Marketing Director
+1 732-562-3824, k.mccabe@ieee.org
PISCATAWAY, N.J., USA, 24 February 2009 -- IEEE has approved work to begin on a revision to IEEE 1650™, "Standard Test Methods for Measurement of Electrical Properties of Carbon Nanotubes." The standard will be developed by the IEEE Nanotechnology Working Group, and is sponsored by the Standards Committee of the IEEE Nanotechnology Council.
This project will revise the existing standard to capture the most current low-level measurement techniques applicable to carbon nanotube characterization. The measurement of carbon nanotubes requires a deep knowledge of low-level electrical measurement techniques, often which is not fully understood by nanotechnology specialists.
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The IEEE Standards Association, a globally recognized standards-setting body, develops consensus standards through an open process that engages industry and brings together a broad stakeholder community. IEEE standards set specifications and best practices based on current scientific and technological knowledge. The IEEE-SA has a portfolio of over 900 active standards and more than 400 standards under development. For information on the IEEE-SA, see: http://standards.ieee.org.
About the IEEE
The IEEE (Institute of Electrical and Electronics Engineers, Inc.) is the world’s largest technical professional society. Through its more than 375,000 members in 160 countries, the organization is a leading authority on a wide variety of areas ranging from aerospace systems, computers and telecommunications to biomedical engineering, electric power and consumer electronics. Dedicated to the advancement of technology, the IEEE publishes 30 percent of the world’s literature in the electrical and electronics engineering and computer science fields, and has developed over 900 active industry standards. The organization annually sponsors more than 850 conferences worldwide. Additional information about the IEEE can be found at http://www.ieee.org.
