IEEE Launches New Standard for Point-of-Care Medical Device Communication
Contact:
Karen McCabe, IEEE-SA Marketing Director
+1 732-562-3824,k.mccabe@ieee.org
PISCATAWAY, N.J., USA, 21 March 2008 -- The IEEE has begun work on a new standard, IEEE P11073-10202™, "Standard for Health Informatics - Point-of-Care Medical Device Communication - Domain Information Model (DIM) - XML Schema Format."The proposed standard will enable or facilitate the automated processing of medical information by translating the presently used Medical Device Data Language (MDDL) - Domain Information Model (DIM), ISO/IEEE 11073-10201, to XML schema format. A greater range of automation tools exist for XML-based formats, and this standard will increase the flexibility and usability of medical information devices.
About the IEEE Standards Association
The IEEE Standards Association, a globally recognized standards-setting body, develops consensus standards through an open process that brings diverse parts of industry together. These standards set specifications and procedures based on current scientific and technological consensus. The IEEE-SA has a portfolio of over 870 active standards and more than 400 standards under development. For information on IEEE-SA see: http://standards.ieee.org/.
About the IEEE
The IEEE (Institute of Electrical and Electronics Engineers, Inc.) is the world’s largest technical professional society. Through its more than 370,000 members in 160 countries, the organization is a leading authority on a wide variety of areas ranging from aerospace systems, computers and telecommunications to biomedical engineering, electric power and consumer electronics. Dedicated to the advancement of technology, the IEEE publishes 30 percent of the world’s literature in the electrical and electronics engineering and computer science fields, and has developed nearly 900 active industry standards. The organization also sponsors or co-sponsors over 450 international technical conferences each year. Additional information about the IEEE can be found at http://www.ieee.org.
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